Charge trapping and intermodulation in HEMTs
Author: Brinkhoff, James.  pp. 799  Date: 2004
ISSN:  0149-645X 
Get full text via these sources:
IEEE Explore (via CrossRef)
IEEE Xplore provides access to abstracts and full-text of: IEEE journals, transactions, and magazines, IEEE conference proceedings and current IEEE standards
Any issues, please contact the library for help: