MOSFET Model Extraction Using 50GHz Four-Port Measurements
Author: Brinkhoff, James.  Published in: 2007 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium, pp. 647- 650  Date: 2007
ISSN:  1529-2517,  DOI:  10.1109/RFIC.2007.380966 
No full text online options
Try the options below:
Request item via InterLibrary Loan:
Any issues, please contact the library for help: