Title Materials and reliability handbook for semiconductor optical and electron devices / Osamu Ueda, Stephen J. Pearton, editors

Published New York, NY : Springer, ©2013

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Description 1 online resource Contents Part 1. Materials Issues and Reliability of Optical Devices -- Reliability Testing of Semiconductor Optical Devices / Mitsuo Fukuda -- Failure Analysis of Semiconductor Optical Devices / Osamu Ueda and Robert W. Herrick -- Failure Analysis Using Optical Evaluation Technique (OBIC) of LDs and APDs for Fiber Optical Communication / Tatsuya Takeshita -- Reliability and Degradation of III-V Optical Devices Focusing on Gradual Degradation / Osamu Ueda -- Catastrophic Optical Damage in High-Power, Broad-Area Laser Diodes / Aland K. Chin and Rick K. Bertaska -- Reliability and Degradation of Vertical-Cavity Surface-Emitting Lasers / Robert W. Herrick -- Structural Defects in GaN-Based Materials and Their Relation to GaN-Based Laser Diodes / Shigetaka Tomiya -- InGaN Laser Diode Degradation / Piotr Perlin and Łucja Marona -- Radiation-Enhanced Dislocation Glide: The Current Status of Research / Koji Maeda -- Mechanism of Defect Reactions in Semiconductors / Yuzo Shinozuka Part 2. Materials Issues and Reliability of Electron Devices -- Reliability Studies in the Real World / William J. Roesch -- Strain Effects in AlGaN/GaN HEMTs / Min Chu, Andrew D. Koehler, Amit Gupta, Srivatsan Parthasarathy and Mehmet Onur Baykan, et al. -- Reliability Issues in AlGaN/GaN High Electron Mobility Transistors / E.A. Douglas, L. Liu, C.F. Lo, B.P. Gila and F. Ren, et al. -- GaAs Device Reliability: High Electron Mobility Transistors and Heterojunction Bipolar Transistors / F. Ren, E.A. Douglas and Stephen J. Pearton -- Novel Dielectrics for GaN Device Passivation and Improved Reliability / F. Ren, Stephen J. Pearton, B.P. Gila, C.R. Abernathy and R.C. Fitch -- Reliability Simulation / M.E. Law, M. Griglione, E. Patrick, N. Rowsey and D. Horton -- The Analysis of Wide Band Gap Semiconductors Using Raman Spectroscopy / Sukwon Choi, Eric Heller, Don Dorsey and Samuel Graham -- Reliability Study of InP-Based HBTs Operating at High Current Density / Yoshino K. Fukai and Kenji Kurishima Summary Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms. Provides the first handbook to cover all aspects of compound semiconductor device reliabilitySystematically describes research results on reliability and materials issues of both optical and electron devices developed since 2000Covers characterization techniques needed to understand failure mechanisms in compound semiconductor devicesIncludes experimental approaches in reliability studiesPresents case studies of laser degradation and HEMT degradation Analysis Physics Electronics Surfaces (Physics) Optics, Optoelectronics, Plasmonics and Optical Devices Optical and Electronic Materials Electronics and Microelectronics, Instrumentation Electronic Circuits and Devices Characterization and Evaluation of Materials Laser Technology, Photonics Bibliography Includes bibliographical references and index Notes English In Springer eBooks Subject Semiconductors -- Materials -- Handbooks, manuals, etc Semiconductors -- Reliability -- Handbooks, manuals, etc Optical materials -- Handbooks, manuals, etc Electronics. Electronics TECHNOLOGY & ENGINEERING -- Mechanical. Physique. Astronomie. Optical materials Semiconductors -- Materials Semiconductors -- Reliability Genre/Form handbooks. Handbooks and manuals Handbooks and manuals. Guides et manuels. Form Electronic book Author Ueda, Osamu. Pearton, S. J. LC no. 2012947361 ISBN 9781461443377 1461443377 1283640295 9781283640299

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