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2020
Grami, Ali, 1955- author
Hoboken, NJ : Wiley, 2020
Rating:
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2020
Little, Roderick J. A., author.
Hoboken, NJ : Wiley, 2020
Rating:
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2020
Strunk, Kamden K.
Rating:
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2020
Dworsky, Lawrence N., 1943- author.
Hoboken, NJ : Wiley, 2020
Rating:
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2020
Xanthakis, John P.
Rating:
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2020
Singh, V. P. (Vijay P.), author.
Cambridge ; New York, NY : Cambridge University Press, 2020
Rating:
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2020
Zito, Richard R., author
Cham : Springer, [2020]
Rating:
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2020
Lee, John C., 1941- author.
Hobken, NJ : John Wiley & Sons, 2020
Rating:
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2020
Gupta, Bhisham C., 1942- author.
Hoboken, NJ : John Wiley & Sons, Inc., 2020
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2020
Croft, William, author.
Leiden ; Boston : Brill, 2020
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2020
Hamilton, James Douglas, author.
Princeton, NJ : Princeton University Press, [2020]
Rating:
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2019
Wiesen, Christopher, author
London : SAGE Publications, Ltd., 2019
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2019
Wiesen, Christopher, author
London : SAGE Publications, Ltd., 2019
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2019
Merlevède, Florence, author
Oxford : Oxford University Press, 2019
Rating:
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2019
Osterlind, Steven J., author
Oxford : Oxford University Press, 2019
Rating:
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2019
Fenton, Norman E., 1956- author
Boca Raton, Florida : CRC Press, [2019]
Rating:
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2019
Betts, Donna J., author
New York, NY : Routledge, 2019
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2019
Boca Raton, FL : CRC Press, 2019
Rating:
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2019
Li, Ming, 1955 July 16- author
Cham : Springer, [2019]
Rating:
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2019
CN (Conference) (26th : 2019 : Kamień Śląski, Poland)
Cham, Switzerland : Springer, [2019]
Rating:
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2019
Cham : Springer, [2019]
Rating:
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2019
Blaunstein, Nathan, author
Hoboken : Wiley-IEEE Press, 2019
Rating:
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2019
Kitamura, Ryosuke
Rating:
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2019
Reich, Brian J. (Brian James), author.
Boca Raton : CRC Press, Taylor & Francis Group, 2019
Rating:
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2019
Cham : Springer, [2019]
Rating:
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2019
IEEE International Conference on Neural Networks (1995 : Washington, D.C.)
New York, NY : Routledge, 2019
Rating:
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2019
Boca Raton, FL : CRC Press, [2019]
Rating:
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2019
Chakraborti, Subhabrata, author
Hoboken, NJ : John Wiley & Sons, 2019
Rating:
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2019
International Conference on Artificial Intelligence and Security (5th : 2019 : New York, N.Y.)
Cham, Switzerland : Springer, [2019]
Rating:
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2019
International SEE Conference on Geometric Science of Information (4th : 2019 : Toulouse, France)
Cham, Switzerland : Springer, 2019
Rating:
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2019
FC (Conference) (23rd : 2019 : Frigate Bay, Saint Kitts and Nevis)
Cham, Switzerland : Springer, 2019
Rating:
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2019
Bayle, Franck.
Newark : John Wiley & Sons, Incorporated, 2019
Rating:
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2019
IEEE International Conference on Computational Science and Engineering ( 2018 : Kota Kinabalu, Malaysia)
Zurich, Switzerland : Trans Tech Publications Ltd., [2019]
Rating:
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2019
Mittelbach, Gary George, author.
Oxford : Oxford University Press, 2019
Rating:
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2019
Knight, Doyle, author
Cambridge ; New York, NY : Cambridge University Press, 2019
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2019
Cham : Springer International Publishing : Imprint: Springer, 2019
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2019
Lu, Naiwei, Lu, author
New York, New York (222 East 46th Street, New York, NY 10017) : Momentum Press, 2019
Rating:
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2019
Amsterdam, Netherlands : Elsevier, [2019]
Rating:
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2019
Damnjanovic, Ivan
Rating:
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2019
Tan, Pang-Ning, author
New York, NY : Pearson Education, Inc., [2019]
Rating:
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2019
Ramlall, Innarain., author
United Kindom : Emerald Publishing Limited, 2019
Rating:
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2019
Winston, Wayne L., author
Boston, MA : Cengage, [2019]
Rating:
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2018
Sampaio de Alencar, Marcelo, author
New York : Momentum Press, [2018]
Rating:
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2018
Allison, Lloyd, author
Cham : Springer, [2018]
Rating:
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2018
Cha, Ji Hwan, author
Cham, Switzerland : Springer, 2018
Rating:
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2018
AAIM (Conference) (12th : 2018 : Dallas, Tex.)
Cham, Switzerland : Springer, 2018
Rating:
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2018
Ramasubramanian, Karthik
Berkeley, CA : Apress L. P., 2018
Rating:
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2018
Mérő, László, author
New Haven, CT : Yale University Press, [2018]
Rating:
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2018
Deaton, Angus, author
Washington, DC : World Bank Group, [2018]
Rating:
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