|
Very relevant titles entries 1-27 |
2024
Guo, Guo-Cong
1st ed
Newark : John Wiley & Sons, Incorporated, 2024
Rating:
|
2023
IUTAM Symposium Advanced Materials Modelling for Structures (6th : 2022 : Magdeburg, Germany)
Cham : Springer, 2023
Rating:
|
2022
Fampa, Marcia, author
Cham, Switzerland : Springer, 2022
Rating:
|
2021
Kim, Jae Kwang
2nd ed
Rating:
|
2018
Gzyl, Henryk
Rating:
|
2016
Singapore : Pan Stanford Publishing, [2016]
Rating:
|
2016
International Modal Analysis Conference (34th : 2016 : Orlando, Fla.)
Cham : Springer, 2016
Rating:
|
2015
Singh, V. P. (Vijay P.), author.
Boca Raton, FL : CRC Press, Taylor & Francis Group, [2015]
Rating:
|
2014
Shrimpton, John, Dr., author
London : Springer, 2014
Rating:
Request It
|
2014
Heidelberg : Springer, 2014
Rating:
|
2013
Gubler, Philipp.
Rating:
|
2012
Christakos, George
Dover edition
Mineola, N.Y. : Dover Publications, 2012
Rating:
|
|
2011
Gzyl, Henryk, 1946-
Rating:
|
2011
International Conference on Material Engineering, Chemistry, Bioinformatics (2011 : Wuhan, China)
Durnten-Zurich : Trans Tech Publications, Ltd., 2011
Rating:
|
|
2006
Popescu, Gelu, 1958-
Rating:
|
2006
Sivia, D. S.
2nd ed. / D.S. Sivia with J. Skilling
Rating:
|
2006
NATO Advanced Study Institute on Electron Crystallography: Novel Approaches for Structure Determination of Nanosized Materials (2004 : Erice, Italy)
Rating:
|
|
2004
Mello, Pier A., author.
Rating:
|
|
|
|
2000
Christakos, George.
Rating:
|
1996
Sivia, D. S.
Oxford : Clarendon Press ; New York : Oxford University Press, 1996
Rating:
Request It
|
1993
Gabardo, Jean-Pierre, 1958-
Rating:
|
Other relevant titles entries 28-209 |
2024
Hu, Weifei
Springer International Publishing AG 2024
Rating:
|
2024
Cham : Springer, [2024]
Rating:
|
2024
Li, Hang, 1965-
Rating:
|
2023
El Hami, Abdelkhalak
Rating:
|
2023
Andersen, Martin
Newark : John Wiley & Sons, Incorporated, 2023
Rating:
|
2023
Cham, Switzerland : Springer, [2023]
Rating:
|
2023
International Symposium on Finite Volumes for Complex Applications (10th : 2023 : Strasbourg, France)
Rating:
|
2023
Ben-Naim, Arieh, author
Cham : Springer, 2023
Rating:
|
|
2022
Wang, Qingsheng
Newark : John Wiley & Sons, Incorporated, 2022
Rating:
|
2022
Lieberman, Norman P., author.
Fifth edition
New York, N.Y. : McGraw Hill LLC, [2022]
Rating:
|
2022
International Conference on Information Modelling and Knowledge Bases (31st : 2021 : Online)
Amsterdam, Netherlands : IOS Press, 2022
Rating:
|
2022
International Conference on Computer Vision and Image Processing (6th : 2021 : Online)
Cham : Springer, [2022]
Rating:
|
2022
Girardin, Valérie
Cham : Springer, 2022
Rating:
|
2022
Cham : Springer, 2022
Rating:
|
2022
Eguchi, Shinto, author
Rating:
|
|
2022
Singh, V. P. (Vijay P.), author.
Cambridge, United Kingdom ; New York, NY : Cambridge University Press, 2022
Rating:
|
2021
Kumar, Akshay, author.
[Place of publication not identified] : River Publishers, 2021
Rating:
|
2021
Kang, Rui, author.
Singapore : Springer, 2021
Rating:
|
2021
CCF BigData (Conference) (8th : 2020 : Chongqing, China)
Rating:
|
2021
Conference on Computational Sciences - Modelling, Computing and Soft Computing (1st : 2020 : Calicut, India)
Singapore : Springer, [2021]
Rating:
|
2021
CCF Conference on Computer Supported Cooperative Work and Social Computing (15th : 2020 : Shenzhen, China)
Singapore : Springer, 2021
Rating:
|
Add Marked to Bag
Add All On Page
|