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2024
Finch, W. Holmes
3rd ed
Rating:
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2023
Poston, Dudley L., 1940- author.
1st edition
New York : Cambridge University Press, 2023
Rating:
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2023
Carpenter, James R
2nd ed
Newark : John Wiley & Sons, Incorporated, 2023
Rating:
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2023
Snelling, Anastasia M
2nd ed
Rating:
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2023
Murphy, Kevin, author.
Fifth edition
Abingdon, Oxon ; New York, NY : Routledge, 2023
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2023
Boca Raton, FL : CRC Press, 2023
Rating:
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2023
ICCSA (Conference) (23rd : 2023 : Athens, Greece)
Cham : Springer, 2023
Rating:
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2023
Sugasawa, Shonosuke, author
Singapore : Springer, [2023]
Rating:
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2023
Psychometric Society. Annual Meeting (87th : 2021 : Bologna, Italy)
Cham : Springer, [2023]
Rating:
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2023
Barreda, Santiago
Rating:
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2022
Siciliano, Michael D., author.
Cambridge, United Kingdom ; New York, NY : Cambridge University Press, 2022
Rating:
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2022
Heck, Ronald H., author
Third edition
London : Routledge, 2022
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2022
Charlotte, NC : IAP/Information Age Publishing, Incorporated, 2022
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2022
Wickrama, K. A. S., author
Second edition
New York, NY : Routledge, Taylor & Francis Group, 2022
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2022
Società italiana di statistica. Riunione scientifica (49th : 2018 : Palermo, Italy)
Cham, Switzerland : Springer, 2022
Rating:
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2022
Weisburd, David, author.
Fifth edition
Cham, Switzerland : Springer, [2022]
Rating:
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2022
International Chinese Statistical Association. Canada Chapter. Symposium (4th : 2019 : Kingston, Ont.)
Rating:
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2022
Cham : Springer, [2022]
Rating:
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2021
He, Yulei, author
First edition
[Place of publication not identified] : Chapman and Hall/CRC, 2021
Rating:
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2021
Cham, Switzerland : Springer, [2021]
Rating:
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2021
Psychometric Society. Annual Meeting (85th : 2020 : Online)
Rating:
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2021
Pardoe, Iain, 1970- author.
Third edition
Hoboken, NJ : John Wiley & Sons, Inc., 2021
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2020
Pardoe, Iain, author
3rd edition
Wiley, 2020
Rating:
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2020
McElreath, Richard, 1973- author.
Second edition
Boca Raton : Chapman & Hall/CRC, 2020
Rating:
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2020
Cambridge, UK ; New York, NY : Cambridge University Press, [2020]
Rating:
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2020
Abingdon, Oxon ; New York, NY : Routledge, an imprint of the Taylor & Francis Group, an informa business, [2020]
Rating:
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2020
Caughey, Devin, author.
Cambridge ; New York, NY : Cambridge University Press, 2020
Rating:
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2020
McElreath, Richard, author
2nd edition
Chapman and Hall/CRC, 2020
Rating:
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2020
Congdon, P., author
Second Edition
Boca Raton, FL : CRC Press, Taylor & Francis Group, [2020]
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2020
Singapore : Springer, 2020
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2020
Singapore : Springer, 2020
Rating:
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2020
Leyland, A. H. (Alastair H.), author.
Cham, Switzerland : Springer Open, [2020]
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2020
London, United Kingdom : Academic Press is an imprint of Elsevier, [2020]
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2019
Pasanen, Tytti P., author
London : SAGE Publications Ltd, 2019
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2019
Gardner, Justin S., author
London : SAGE Publications Ltd, 2019
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2019
Krupa, Olha, author
London : SAGE Publications Ltd, 2019
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2019
To, Yen, author
London : SAGE Publications, Ltd., 2019
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2019
Chi, Guangqing, author.
Thousand Oaks : SAGE Publications, Inc, 2019
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2019
Twisk, Jos W. R., 1962- author.
[Second edition]
Cambridge ; New York, NY : Cambridge University Press, 2019
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2019
Finch, W. Holmes
2nd ed
Milton : CRC Press LLC, 2019
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2019
Second edition
New York : Routledge, 2019
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2019
Charlotte, NC : Information Age Publishing, Inc., [2019]
Rating:
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2019
PAKDD (Conference) (23rd : 2019 : Macau, China)
Cham : Springer, 2019
Rating:
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2019
Leppink, Jimmie, author
Cham, Switzerland : Springer, [2019]
Rating:
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2018
Dobson, Annette J., 1945-, author
Fourth edition
Boca Raton, FL : CRC Press, Taylor & Francis Group, [2018]
Rating:
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2018
Zuur, Alain F., author
Newburgh, United Kingdom : Highland Statistics Ltd., 2018
Rating:
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2018
Van der Linden, Wim J
Rating:
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2018
Ma, Xin, 1963- author.
Charlotte, N.C. : Information Age Publishing Inc., [2018]
Rating:
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2018
Ferrer, Emilio
Rating:
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