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3
|
|
Interconnects (Integrated circuit technology) -- Defects -- Congresses. : Stress-induced phenomena in metallization : Seventh International Workshop on Stress-Induced Phenomena in Metallization, Austin, Texas, 14-16 June 2004 / editors, Paul S. Ho [and others]
|
2004
|
1
|
|
4
|
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Interconnects (Integrated circuit technology) -- Design : Low power interconnect design / Sandeep Saini
|
2015
|
1
|
|
5
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Interconnects (Integrated circuit technology) -- Design and construction : Three-dimensional molded interconnect devices (3D-MID) : materials, Manufacturing, assembly, and applications for injection molded circuit carriers / Jörg Franke
|
2014
|
1
|
|
6
|
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Interconnects (Integrated circuit technology) -- Materials : Electromigration in metals : fundamentals to nano-interconnects / Paul S. Ho, Chao-Kun Hu, Martin Gall, Valeriy Sukharev
|
2022
|
1
|
|
8
|
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Interconnects (Integrated circuit technology) -- Simulation methods : Compact models and measurement techniques for high-speed interconnects / Rohit Sharma, Tapas Chakravarty
|
2012
|
1
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