| Description |
1 online resource (xix, 685 pages) : illustrations |
| Contents |
Introduction -- Reliability building -- Reliability assessment -- Package and reliability -- Failure analysis -- Test and testability -- Reliability of passive electronic parts -- Reliability of diodes -- Silicon power transistor reliability -- Reliability of optoelectronic components -- Reliability of thyristors and triacs -- Reliability of monolithic ICs -- Reliability of memories and microprocessors -- Reliability of hybrid ICs -- Reliability of micro- and nanosystems |
| Summary |
"The main reason for the premature breakdown of today s electronic products (computers, cars, tools, appliances, etc.) is the failure of the components used to build these products. To help ensure longer-lasting, more technically sound products and systems, a solid understanding of effective ways to minimize the degradation is essential." "This practical book offers you specific guidance on how to design more reliable components and build more reliable electronic systems. You learn how to optimize a virtual component prototype, accurately monitor product reliability during the entire production process, and add the burn-in and selection procedures that are the most appropriate for your applications. Moreover, the book helps you ensure that all components are correctly applied, margins are adequate, wear-out failure modes are prevented during the expected duration of life, and system interfaces cannot lead to failure."--Jacket |
| Bibliography |
Includes bibliographical references and index |
| Notes |
Print version record |
| Subject |
Electronic systems -- Testing
|
|
Reliability (Engineering)
|
|
Component software -- Reliability
|
|
Software architecture -- Reliability
|
|
Electronic systems -- Testing.
|
|
Reliability (Engineering)
|
| Form |
Electronic book
|
| Author |
Bâzu, M. I. (Marius I.), 1948-
|
| ISBN |
9781523119271 |
|
1523119276 |
|
