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Authors (Last name first) (1-2 of 2)
Beanland, R.
1
2001
Electron microscopy and analysis
Goodhew, Peter J.
Third edition
London : Taylor & Francis, [2001]
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W'PONDS
502.825 Goo/Ema 2001
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2
2017
Electron microscopy and analysis
Goodhew, Peter J., author.
Third edition
Boca Raton : CRC Press, Taylor & Francis Group, 2017
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