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E-book

Title Characterization of high Tc materials and devices by electron microscopy / edited by Nigel D. Browning, Stephen J. Pennycook
Published Cambridge ; New York : Cambridge University Press, 2000

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Description 1 online resource (xii, 391 pages) : illustrations
Contents Cover; Half-title; Title; Copyright; Contents; Contributors; Preface; 1 High-resolution transmission electron microscopy; 2 Holography in the transmission electron microscope; 3 Microanalysis by scanning transmission electron microscopy; 4 Specimen preparation for transmission electron microscopy; 5 Low-temperature scanning electron microscopy; 6 Scanning tunneling microscopy; 7 Identification of new superconducting compounds by electron microscopy; 8 Valence band electron energy loss spectroscopy (EELS) of oxide superconductors
Summary This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications
Bibliography Includes bibliographical references
Notes English
Print version record
Subject High temperature superconductors.
Electron microscopy -- Technique.
TECHNOLOGY & ENGINEERING -- Superconductors & Superconductivity.
Electron microscopy -- Technique
High temperature superconductors
Elektronenmikroskopie
Hochtemperatursupraleiter
Form Electronic book
Author Browning, Nigel D
Pennycook, Stephen J
LC no. 99018754
ISBN 0511039662
9780511039669
9780511534829
0511534825
9780511038150
0511038151
9786610417018
6610417016
1107113016
9781107113015
1280417013
9781280417016
0511175078
9780511175077
0511155174
9780511155178
0511328664
9780511328664
9780521031707
0521031702