| Description |
1 online resource (521 p.) |
| Contents |
Cover -- Half Title -- Title Page -- Copyright Page -- Contents -- Preface -- Preface to the First Edition -- Chapter 1: Introduction -- 1.1. Looking Back to Milestones -- References -- Chapter 2: Alignment, Pointing, and Sizing Instruments -- 2.1. Alignment -- 2.2. Pointing and Tracking -- 2.2.1. The Quadrant Photodiode -- 2.2.2. The Position Sensing Detector -- 2.3. Laser Level -- 2.4. Wire Diameter Sensor -- 2.5. Particle Sizing -- References -- Problems and Questions -- Chapter 3: Laser Telemeters -- 3.1. Triangulation -- 3.2. Time-of-Flight Telemeters -- 3.2.1. Power Budget |
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3.2.2. System Equation -- 3.2.3. Accuracy of the Pulsed Telemeter -- 3.2.3.1. Effect of Non-Idealities -- 3.2.3.2. Optimum Filter for Signal Timing -- 3.2.4. Accuracy of the Pulsed Long-Wave Telemeter -- 3.2.5. Accuracy of the Sine-Wave Telemeter -- 3.2.6. The Ambiguity Problem -- 3.2.7. Intrinsic Accuracy and Calibration -- 3.2.8. Transmitter and Receiver Optics -- 3.3. Instrumental Developments of Telemeters -- 3.3.1. Pulsed Telemeter -- 3.3.1.1. Improvement to the Basic Pulsed Setup -- 3.3.1.2. Enhancing Resolution with Slow Pulses -- 3.3.1.3. Slow Pulse Telemeters for the Automotive (LiDAR) |
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3.3.2. Sine-Wave Telemeter -- 3.4. 3D and Imaging Telemeters -- 3.5. LIDAR and LADAR -- References -- Problems and Questions -- Chapter 4: Laser Interferometry -- 4.1. Overview of Interferometry Applications -- 4.2. The Basic Laser Interferometer -- 4.2.1. The Two-Beam Laser Interferometer -- 4.2.2. The Two-Frequency Laser Interferometer -- 4.2.2.1. Extending the Digital Displacement Measurements to Nanometers -- 4.2.2.2. Integrated Optics Interferometers -- 4.2.3. The FMCW Interferometer for Distance Measurement -- 4.2.4. Comb Frequency Interferometry |
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4.2.5. Measuring with the Laser Interferometer -- 4.2.5.1. Multiaxis Extension -- 4.2.5.2. Measurement of Angle and Planarity -- 4.2.5.3. Rectangularity Measurement -- 4.2.5.4. Extending the Measurement on Diffusing Targets -- 4.3. Operation Mode and Performance Parameters -- 4.4. Ultimate Limits of Performance -- 4.4.1. Quantum Noise Limit -- 4.4.2. Temporal Coherence -- 4.4.3. Spatial Coherence and Polarization State -- 4.4.4. Dispersion of the Medium -- 4.4.5. Thermodynamic Phase Noise -- 4.4.6. Brownian Motion -- 4.4.7. Speckle-Related Errors -- 4.5. Vibration Sensing |
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4.5.1. Short Stand-off Vibrometry -- 4.5.2. Long Stand-off Vibrometry -- 4.6. Read-Out Configurations of Interferometry -- 4.6.1. Internal Configuration -- 4.6.2. Injection (or Self-Mixing) Configuration -- 4.7. White Light Interferometry and OCT -- 4.7.1. Profilometry for Industrial Applications -- 4.7.2. OCT for Biomedical Applications -- References -- Problems and Questions -- Chapter 5: Self-Mixing Interferometry -- 5.1. Injection at Weak-Feedback Level -- 5.1.1. Bandwidth and Noise of the SMI -- 5.1.2. The He-Ne SMI -- 5.2. Analysis of Injection at Medium-Feedback Level |
| Notes |
Description based upon print version of record |
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5.2.1. Analysis by the Three Mirror Model |
| Subject |
Optoelectronic devices.
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Electrooptical devices.
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Lasers.
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Measuring instruments.
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Engineering instruments.
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Scientific apparatus and instruments.
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lasers (optical instruments)
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measuring devices (instruments)
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scientific instruments.
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Electrooptical devices.
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Engineering instruments.
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Lasers.
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Measuring instruments.
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Optoelectronic devices.
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Scientific apparatus and instruments.
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| Form |
Electronic book
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| ISBN |
9781000895728 |
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1000895726 |
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