Encyclopedia of materials characterization : surfaces, interfaces, thin films / editors, C. Richard Brundle, Charles A. Evans, Jr., Shaun Wilson ; managing editor, Lee E. Fitzpatrick
Introduction and summaries -- Imaging techniques (Microscopy) -- Electron beam instruments -- Structure determination by diffraction and scattering -- Electron emission spectroscopies -- X-ray emission techniques -- Visible/UV emission, reflection, and absorption -- Vibrational spectroscopies and NMR -- Ion scattering techniques -- Mass and optical spectroscopies -- Neutron and nuclear techniques -- Physical and magnetic properties
Summary
Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the Series. It describes widely-ranging techniques in a jargon-free manner and includes summary pages for each technique to supply a quick survey of its capabilities
Analysis
Surfaces Analysis
Bibliography
Includes bibliographical references and index
Notes
Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. http://purl.oclc.org/DLF/benchrepro0212 MiAaHDL
English
Print version record
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