Limit search to available items
Book Cover
Author Fan, Yongquan, 1970-

Title Accelerating test, validation and debug of high speed serial interfaces / Yongquan Fan, Zeljko Zilic
Published Dordrecht ; London : Springer, 2011
Online access available from:
Springer eBooks    View Resource Record  


Description 1 online resource (xii, 194 pages) : illustrations (some color)
Contents Accelerating receiver jitter tolerance testing on ATE -- Transmitter jitter extractions on ATE -- Testing HSSIs with or without ATE instruments -- BER testing under noise
Summary High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive instruments. "Accelerating Test, Validation and Debug of High Speed Serial Interfaces" provides innovative test and debug approaches and detailed instructions on how to arrive to practical test of modern high-speed interfaces. "Accelerating Test, Validation and Debug of High Speed Seria
Bibliography Includes bibliographical references and index
Notes Print version record
Subject Interface circuits -- Testing.
Very high speed integrated circuits -- Testing.
Form Electronic book
Author Zilic, Zeljko.
LC no. 2010938288
ISBN 9048193974
9048193982 (electronic bk.)
9789048193981 (electronic bk.)