Quantitative microbeam analysis : proceedings of the Fortieth Scottish Universities Summer School in Physics, Dundee, August 1992 / edited by A.G. Fitzgerald, B.E. Storey, D. Fabian
Published
Bristol : The School ; Philadelphia : Institute of Physics Pub., [1993]
Quantification in AES and XPS / M.P. Seah -- Surface Analytical Imaging / M. Prutton -- Electronic Structure and Electron Spectroscopy / G. Van der Laan -- Auger Electron Spectroscopy in the STEM / P. Kruit -- Electron Energy-Loss Spectroscopy -- EELS / R.F. Egerton -- Light Element Microanalysis and Imaging / D.B. Williams -- A Comparison of Quantification Methods and Analytical Techniques / A.G. Fitzgerald -- Data Analysis and Processing / P. Trebbia -- Microscopy and Microanalysis of Insulating Materials / J. Cuzaux -- Electron Specimen Interactions / D.C. Joy -- Electron Probe X-ray Microanalysis / P. Van Espen -- Energy Dispersive X-Ray Analysis (EDX) in the TEM/STEM / J.M. Titchmarsh -- Analysis and Imaging by Proton-Induced X-Ray Emission (PIXE) / J.L. Campbell -- Ion-Beam Analytical Techniques -- Rutherford Backscattering, Elastic Recoil and Nuclear Reaction Analysis / E.A. Maydell -- Quantitative Analysis of Solids by SIMS and SNMS / K. Wittmaack -- Static SIMS / D. Briggs
Applications of Surface, Interface and Thin Film Analysis in an Industrial Research Laboratory / H.W. Werner -- Ion-Induced Auger Electron Emission From Solids / D.J. Fabian -- Resonance Ionisation Mass Spectrometry (RIMS) / K.W. Ledingham
Notes
"A Nato Advanced Study Institute."
Bibliography
Includes bibliographical references and index
Notes
Description based on print version record and CIP data provided by publisher
