| Description |
xii, 114 pages : illustrations ; 24 cm |
| Series |
Microscopy handbooks ; 39 |
|
Microscopy handbooks ; 39
|
| Contents |
1. Why STEM? - STEM versus TEM -- 2. STEM optics -- 3. The specimen -- 4. Imaging in the STEM -- 5. Diffraction in the STEM -- 6. Microanalysis in the STEM -- 7. Mapping in the STEM -- 8. Limits to STEM and advanced STEM |
| Summary |
Scanning Transmission Electron Microscopy (STEM) is one of the highest resolution methods for performing microanlysis on thin sections of material. The technique is used in many modern transmission electron microscopes, and an increasing number of specialized instruments dedicated to STEM are being developed. This book provides an up-to-date introduction to the principles and major applications of STEM |
| Notes |
"In association with the Royal Microscopical Society." |
| Bibliography |
Includes bibliographical references and index |
| Subject |
Scanning transmission electron microscopy.
|
| Author |
Keyse, Robert J.
|
|
Royal Microscopical Society (Great Britain)
|
| LC no. |
97031937 |
| ISBN |
0387915176 (softcover : alk. paper) |
|
