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E-book

Title Dynamic characterisation of analogue-to-digital converters / by Dominique Dallet and José Machado da Silva (eds.)
Published Dordrecht : Springer, ©2005

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Description 1 online resource (xx, 280 pages) : illustrations
Series The Kluwer international series in engineering and computer science ; SECS 860. Analog circuits and signal processing
Kluwer international series in engineering and computer science. Analog circuits and signal processing.
Kluwer international series in engineering and computer science ; SECS 860
Contents ADC Characterisation Based on Sinewave Analysis -- ADC Applications, Architectures and Terminology -- Sinewave Test Setup -- Time-Domain Data Analysis -- Frequency-Domain Data Analysis -- Code Histogram Test -- Comparative Study of ADC Sinewave Test Methods -- Measurement of Additional Parameters -- Jitter Measurement -- Differential Gain and Phase Testing -- Step and Transient Response Measurement -- Hysteresis Measurement
Summary The Analogue-to-digital converter (ADC) is the most pervasive block in electronic systems. This book presents an overview of the methods and procedures employed for characterising ADCs dynamic performance behaviour using sinusoidal stimuli. It describes the three classical methods - histogram, sine wave fitting, and spectral analysis
Bibliography Includes bibliographical references and index
Notes English
Print version record
Subject Analog-to-digital converters -- Testing
TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- Integrated.
TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- General.
Analog-to-digital converters -- Testing.
Ingénierie.
Analog-to-digital converters -- Testing
Form Electronic book
Author Dallet, Dominique, 1964-
Silva, José Machado da
ISBN 9780387259031
0387259031
0387259023
9780387259024
128061076X
9781280610769
6610610762
9786610610761