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Title Radiation effects on embedded systems / edited by Raoul Velazco, Pascal Fouillat and Ricardo Reis
Published Dordrecht ; [London] : Springer, [2007]
©2007
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Description 1 online resource (viii, 269 pages) : illustrations
Contents Cover -- Contents -- Preface -- Radiation Space Environment -- Radiation Effects in Microelectronics -- In-flight Anomalies on Electronic Devices -- Multi-Level Fault Effects Evaluation -- Effects of Radiation on Analog and Mixed-Signal Circuits -- Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing -- Design Hardening Methodologies for ASICs -- Fault Tolerance in Programmable Circuits -- Automatic Tools for Design Hardening -- Test Facilities for SEE and Dose Testing -- Error Rate Prediction of Digital Architectures: Test Methodology and Tools -- Using the SEEM Software for Laser SET Testing and Analysis -- Last Page
Summary "Radiation Effects on Embedded Systems" aims at providing the reader with the major guidelines for coping with radiation effects on components supposed to be included in today's application devoted to operate in space, but also in the atmosphere at high altitude or at ground level. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, from 20 to 25 November 2005. This book will provide all IC engineers with useful information regarding outside (environmental) influences on their designs, in this way we see this to be an excellent reference
Bibliography Includes bibliographical references and index
Notes Print version record
In Springer e-books
Subject Embedded computer systems.
Integrated circuits -- Effect of radiation on.
Form Electronic book
Author Velazco, Raoul.
Fouillat, Pascal.
Reis, Ricardo A. L. (Ricardo Augusto da Luz)
LC no. 2007465768
ISBN 1280943661
1402056451 (hbk.)
140205646X
6610943664
9781280943669
9781402056451 (hbk.)
9781402056468
9786610943661