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Book Cover
E-book
Author Welberry, T. R

Title Diffuse X-Ray Scattering and Models of Disorder
Edition 2nd ed
Published Oxford : Oxford University Press USA - OSO, 2022

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Description 1 online resource (425 p.)
Series International Union of Crystallography Monographs on Crystallography Ser. ; v.31
International Union of Crystallography Monographs on Crystallography Ser
Contents Cover -- Titlepage -- Copyright -- Preface -- Preface to second edition -- Contents -- Part I Experiment -- 1 Measurement of diffuse scattering -- 1.1 Introduction -- 1.2 2D data collection -- 1.2.1 Using a linear position-sensitive detector -- 1.2.2 Using image-plates at a synchrotron -- 1.3 3D data collection -- 1.3.1 Using an automatic IP detector -- 1.3.2 Using a CCD detector -- 1.3.3 Single photon-counting hybrid pixel detectors -- 1.4 Diffuse neutron scattering -- 1.4.1 Spallation neutrons I -SXD instrument at ISIS
1.4.2 Spallation neutrons II-cross-correlation spectrometer Corelli at SNS -- 1.5 Electron diffraction -- Part II Disorder Models -- 2 Disorder in one dimension -- 2.1 Diffraction intensity -- 2.2 One-dimensional disorder-layer structures -- 2.3 Correlations and short-range order -- 2.4 Restrictions on correlation coefficients -- 3 Particular disorder models -- 3.1 The simple Markov chain -- 3.2 Alternative treatment for Markov chains-stochastic matrices -- 3.3 The 1D Ising model -- 3.4 Models involving second-nearest-neighbour and more distant interactions -- 3.4.1 Linear form
6.5 Gaussian growth-disorder models in 3D and higher -- 6.6 Conversion of Gaussian to binary variables -- 7 Interactions between occupancies and displacements -- 7.1 General intensity expressions -- 7.2 A possible Ising-like model for occupations and displacements -- 7.3 Use of force models and Monte Carlo simulation -- 7.4 Illustration of the meaning of the different intensity components -- 7.5 Size-effect and multi-site correlations -- Part III Examples Of Real Disordered Systems I -- 8 1,3-dibromo-2,5-diethyl-4,6-dimethylbenzene (Bemb2) -- 8.1 Introduction -- 8.2 Symmetry considerations
Summary Diffuse X-ray scattering is a rich and virtually untapped source of local structural information over and above that obtained by conventional crystallography; the book aims to show how computer simulation of a model crystal provides a general method by which diffuse scattering from all types of materials can be interpreted and analysed
Notes Description based upon print version of record
8.2.1 q = 0 modulations
Form Electronic book
ISBN 9780192607409
0192607405