Title Fundamentals of powder diffraction and structural characterization of materials / by Vitalij K. Pecharsky, Peter Y. Zavalij

Published New York : Springer, 2005

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Description 713 pages : illustrations ; 24 cm + 1 CD-ROM (4 3/4 in.) Notes Originally published: Boston : Kluwer Academic Publishers, c2003 Bibliography Includes bibliographical references Subject X-rays -- Diffraction -- Measurement. Powders -- Optical properties -- Measurement. X-ray crystallography. Author Zavalij, Peter Y. LC no. 2005042474 ISBN 0387241477 softcover 0387245677 e-book

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