| Description |
1 online resource |
| Contents |
Basic Concepts of X-Ray Diffraction; Contents; Preface; Chapter Introduction; Chapter 1 Diffraction Phenomena in Optics; Chapter 2 Wave Propagation in Periodic Media; Chapter 3 Dynamical Diffraction of Particles and Fields: General Considerations; 3.1 The Two-Beam Approximation; 3.2 Diffraction Profile: The Laue Scattering Geometry; 3.3 Diffraction Profile: The Bragg Scattering Geometry; Chapter 4 Dynamical X-Ray Diffraction: The Ewald-Laue Approach; 4.1 Dynamical X-Ray Diffraction: Two-Beam Approximation; 4.1.1 The Role of X-Ray Polarization |
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4.1.2 The Two-Branch Isoenergetic Dispersion Surface for X-Rays4.1.3 Isoenergetic Dispersion Surface for Asymmetric Reflection; Chapter 5 Dynamical Diffraction: The Darwin Approach; 5.1 Scattering by a Single Electron; 5.2 Atomic Scattering Factor; 5.3 Structure Factor; 5.4 Scattering Amplitude from an Individual Atomic Plane; 5.5 Diffraction Intensity in the Bragg Scattering Geometry; Chapter 6 Dynamical Diffraction in Nonhomogeneous Media: The Takagi-Taupin Approach; 6.1 Takagi Equations; 6.2 Taupin Equation; 6.2.1 Taupin Equation: The Symmetric Laue Case |
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6.2.2 Taupin Equation: The Symmetric Bragg Case6.2.3 Solution of the Taupin Equation for Multilayered Structures; Chapter 7 X-Ray Absorption; Chapter 8 Dynamical Diffraction in Single-Scattering Approximation: Simulation of High-Resolution X-Ray Diffraction in Heterostructures and Multilayers; 8.1 Direct Wave Summation Method; Chapter 9 Reciprocal Space Mapping and Strain Measurements in Heterostructures; Chapter 10 X-Ray Diffraction in Kinematic Approximation; 10.1 X-Ray Polarization Factor; 10.2 Debye-Waller Factor; Chapter 11 X-Ray Diffraction from Polycrystalline Materials |
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11.1 Ideal Mosaic Crystal11.2 Powder Diffraction; Chapter 12 Applications to Materials Science: Structure Analysis; Chapter 13 Applications to Materials Science: Phase Analysis; 13.1 Internal Standard Method; 13.2 Rietveld Refinement; Chapter 14 Applications to Materials Science: Preferred Orientation (Texture) Analysis; 14.1 The March-Dollase Approach; Chapter 15 Applications to Materials Science: Line Broadening Analysis; 15.1 Line Broadening due to Finite Crystallite Size; 15.1.1 The Scherrer Equation; 15.1.2 Line Broadening in the Laue Scattering Geometry |
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15.2 Line Broadening due to Microstrain Fluctuations15.3 Williamson-Hall Method; 15.4 The Convolution Approach; 15.5 Instrumental Broadening; 15.6 Relation between Grain Size-Induced and Microstrain-Induced Broadenings of X-Ray Diffraction Profiles; Chapter 16 Applications to Materials Science: Residual Strain/Stress Measurements; 16.1 Strain Measurements in Single-Crystalline Systems; 16.2 Residual Stress Measurements in Polycrystalline Materials; Chapter 17 Impact of Lattice Defects on X-Ray Diffraction; Chapter 18 X-Ray Diffraction Measurements in Polycrystals with High Spatial Resolution |
| Summary |
Authored by a university professor deeply involved in X-ray diffraction-related research, this textbook is based on his lectures given during more than 20 years for graduate students. It adopts a well-balanced approach, describing basic concepts and experimental techniques, which make X-ray diffraction an unsurpassed method for studying the structure of materials. Both dynamical and kinematic X-ray diffraction is considered from a unified viewpoint, in which the dynamical diffraction in single-scattering approximation serves as a bridge between these two parts. The text emphasizes the fundamen |
| Bibliography |
Includes bibliographical references and index |
| Notes |
Print version record |
| Subject |
X-rays -- Diffraction.
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X-Ray Diffraction
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x-ray diffraction.
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SCIENCE -- Physics -- Crystallography.
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X-rays -- Diffraction.
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| Form |
Electronic book
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| ISBN |
9783527681143 |
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3527681140 |
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9781306461443 |
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1306461448 |
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9783527681181 |
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3527681183 |
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