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Book Cover
Book
Author Hosmer, David W., author

Title Applied logistic regression / David W. Hosmer, Jr., Stanley Lemeshow
Published New York : Wiley, [1989]
New York : Wiley, c1989
©1989

Copies

Location Call no. Vol. Availability
 W'PONDS  519.536 Hos/Alr  TEMPORARILY UNAVAILABLE
 MELB  519.536 HOS-A  TEMPORARILY UNAVAILABLE
 MELB  519.536 Hos/Alr  TEMPORARILY UNAVAILABLE
Description xiii, 307 pages ; 24 cm
Series Wiley series in probability and mathematical statistics
Wiley series in probability and mathematical statistics. Applied probability and statistics.
Contents 1. Introduction to the logistic regression model -- 2. The multiple logistic regression model -- 3. Interpretation of the coefficients of the logistic regression model -- 4. Model-building strategies and methods for logistic regression -- 5. Assessing the fit of the model -- 6. Application of logistic regression with different sampling models -- 7. Logistic regression for matched case-control studies -- 8. Special topics
Notes "A Wiley-Interscience publication."
Bibliography Includes bibliographical references (pages 291-300) and index
Subject Regression analysis.
Regression analysis.
Author Lemeshow, Stanley, author
LC no. 89031893
ISBN 0471615536