| Description |
xxiv, 679 pages : illustrations, portraits ; 24 cm |
| Contents |
Excitation and nature of X-rays; X-ray spectra -- Properties of X-ray -- X-ray secondary-emission (fluorescence) spectrometry; general introduction -- Excitation -- Dispersion -- Detection -- Measurement -- Pulse-height analysis; nondispersive analysis -- Laboratory, automated, and special X-ray spectrometers -- Qualitative and semiquantitative analysis -- Precision and error; counting statistics -- Absorption-enhancement effects -- Sensitivity and resolution; spectral-line interference -- Methods of quantitative analysis -- Mathematical correction of absorption-enhancement effects -- Specimen preparation and presentation--general, solids, powders, briquets, fusion products -- Specimen preparation and presentation--liquids; supported specimens -- Measurement of thickness of films and platings -- Selected-area analysis -- Other analytical methods based on emission, absorption, and scatter of X-rays; other spectrometric methods involving X-rays -- The electron-probe microanalyzer |
| Notes |
Bibliography: p. 643-671 |
| Bibliography |
Bibliography: pages 643-671 |
| Subject |
X-ray spectroscopy.
|
| LC no. |
74107536 |
| ISBN |
030630435X |
|
