| Description |
1 online resource (327 pages) : illustrations (chiefly color) |
| Series |
NanoScience and technology |
|
Nanoscience and technology.
|
| Contents |
Intro -- Preface -- Historical Overview -- References -- Contents -- Part I Principle and Techniques of HS-AFM -- 1 Principle of AFM -- 1.1 Image Formation and Spatial Resolution -- 1.2 Configuration of AFM System -- 1.3 Imaging Modes -- 1.3.1 DC and AC Modes -- 1.3.2 Other AC Mode Issues -- 1.3.3 Phase Contrast and Energy Dissipation -- 1.3.4 FD Curve-Based AFM -- 1.3.5 Recognition Imaging -- References -- 2 Cantilever Mechanics -- 2.1 Static Mechanics of Cantilever Beam -- 2.2 Dynamic Mechanics of Cantilever Beam -- 3 Feedback Control and Imaging Rate -- 3.1 Highest Possible Imaging Rate |
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3.2 PID Feedback Control and Parachuting Problem -- References -- 4 HS-AFM System and Optimized Instrumental Components -- 4.1 Short Cantilevers -- 4.1.1 Mechanical Properties -- 4.1.2 Other Advantages of Short Cantilevers -- 4.1.3 Practical Issues for the Use of Short Cantilevers -- 4.1.4 Cantilever Excitation -- 4.2 OBD Detector for Short Cantilevers -- 4.3 Fast Amplitude Detector -- 4.4 Fast Phase Detector -- 4.5 Fast Scanner -- 4.5.1 Piezo Actuator -- 4.5.2 Holding Methods and Momentum Balance -- 4.5.3 Scanner Designs Without Displacement Amplification |
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4.5.4 Scanner Designs with Displacement Amplification -- 4.5.5 Dual Actuation for Z-Scanner -- 4.5.6 Piezo Driver -- 4.6 Dynamic PID Control to Avoid Parachuting -- 4.7 Measured and Theoretical Feedback Bandwidths -- 4.8 Compensation for Cantilever Excitation Drifts -- 4.9 Control Methods for Vibration Damping -- 4.9.1 Active Vibration Damping Method for Z-Scanner -- 4.9.2 Measured Effects of Q-Control on Z-Scanner Response -- 4.9.3 Rounding and Feedforward Vibration Damping Methods for X-Scanner -- 4.9.4 Measured Effects of Vibration Damping for X-Scanner |
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4.10 Compensation for Nonlinearity and Crosstalk in Wide-Area XY-Scanner -- References -- 5 Tip-Scanning HS-AFM -- 5.1 Advantage and OBD Detectors of Tip-Scanning AFM -- 5.2 General Considerations for Motion Tracking -- 5.3 Tracking by Mirror Tilter Scanning -- 5.4 Tracking by Lens Scanning -- 5.5 Tip-Scanning HS-AFM Combined with TIRF Microscopy -- References -- 6 Interactive HS-AFM (iHS-AFM) -- 6.1 Several Interactive Modes -- 6.2 Applications of iHS-AFM -- References -- 7 Influence of Tip-Sample Interactions on Specimens -- 7.1 Quantification of Vertical Tip Force Effect |
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7.2 Lateral Tip Force Effect -- References -- 8 Toward the Next Generation of HS-AFM -- 8.1 Speed Performance -- 8.2 Less Disturbing Imaging Method -- 8.2.1 Error Difference Between Trace and Retrace Imaging Processes -- 8.2.2 Only Trace Imaging (OTI) Mode -- 8.3 Future Prospects for Higher Imaging Rate -- References -- Part II Biological Applications of HS-AFM -- 9 Overview of Bioimaging with HS-AFM -- 9.1 Overview of HS-AFM Applications -- 9.2 Various Issues to be Considered -- References -- 10 Substrate Surfaces -- 10.1 Mica Surfaces -- 10.2 Mica-Supported Lipid Bilayer Surfaces |
| Summary |
This first book on high-speed atomic force microscopy (HS-AFM) is intended for students and biologists who want to use HS-AFM in their research. It provides straightforward explanations of the principle and techniques of AFM and HS-AFM. Numerous examples of HS-AFM studies on proteins demonstrate how to apply this new form of microscopy to specific biological problems. Several precautions for successful imaging and the preparation of cantilever tips and substrate surfaces will greatly benefit first-time users of HS-AFM. In turn, the instrumentation techniques detailed in Chapter 4 can be skipped, but will be useful for engineers and scientists who want to develop the next generation of high-speed scanning probe microscopes for biology. The book is intended to facilitate the first-time use of this new technique, and to inspire students and researchers to tackle their own specific biological problems by directly observing dynamic events occurring in the nanoscopic world. Microscopy in biology has recently entered a new era with the advent of high-speed atomic force microscopy (HS-AFM). Unlike optical microscopy, electron microscopy, and conventional slow AFM, it allows us to directly observe biological molecules in physiological environments. Molecular "movies" created using HS-AFM can directly reveal how molecules behave and operate, without the need for subsequent complex analyses and roundabout interpretations. It also allows us to directly monitor morphological change in live cells, and dynamic molecular events occurring on the surfaces of living bacteria and intracellular organelles. As HS-AFM instruments were recently commercialized, in the near future HS-AFM is expected to become a common tool in biology, and will enhance and accelerate our understanding of biological phenomena |
| Bibliography |
Includes bibliographical references and index |
| Notes |
Description based upon print version of record |
| Subject |
Atomic force microscopy.
|
|
Biomolecules -- Microscopy
|
|
Atomic force microscopy
|
| Form |
Electronic book
|
| ISBN |
9783662647851 |
|
3662647850 |
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