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Author Freeman, Yuri

Title Tantalum and Niobium-Based Capacitors : Science, Technology, and Applications
Published Cham : Springer International Publishing, 2017
Online access available from:
Springer eBooks    View Resource Record  


Description 1 online resource (133 pages)
Contents ""Dedication""; ""Acknowledgments""; ""Contents""; ""About the Author""; ""Introduction""; ""Chapter 1: Major Degradation Mechanisms""; ""1.1 Oxygen Migration""; ""1.2 Field Crystallization""; ""1.3 Thermal Crystallization""; ""1.4 Interaction Between Oxygen Migration and Crystallization""; ""Chapter 2: Basic Technology""; ""2.1 Anode Manufacturing""; ""2.2 Ta2O5 Dielectric""; ""2.3 Cathode""; ""2.4 External Layers, Encapsulating, and Testing""; ""Chapter 3: Applications""; ""3.1 High Charge and Energy Efficiency""; ""3.2 De-rating and High Reliability""
""3.3 High-Voltage Polymer Tantalum Capacitors""""3.4 Asymmetric Conduction and Stability""; ""3.5 Anomalous Currents in Polymer Tantalum Capacitors""; ""3.6 High-Temperature Applications""; ""3.7 Niobium and Niobium Oxide Capacitors""; ""Chapter 4: Conclusion""; ""References""
Summary This book provides a comprehensive analysis of the science, technology, and applications of Tantalum and Niobium-based capacitors. The author discusses fundamentals, focusing on thermodynamic stability, major degradation processes and conduction mechanisms in the basic structure of Me-Me2O5-cathode (Me: Ta, Nb). Technology-related coverage includes chapters technology chapters on the major manufacturing steps from capacitor grade powder to the testing of finished capacitors. Applications discussed include high reliability, high charge and energy efficiency, high working voltages, high temperatures, etc. The links between the scientific foundation, breakthrough technologies and outstanding performance and reliability of the capacitors are demonstrated. The theoretical models discussed include the thermodynamics of the amorphous dielectrics, conduction mechanisms in metal-insulator-semiconductor (MIS) structures, band diagrams of the organic semiconductors, etc. Provides a single-source reference to the science, technology, and applications of Tantalum and Niobium-based capacitors; Focuses on Polymer Tantalum capacitors, with rapidly growing applications in special and commercial electronics; Discusses in detail conduction and degradation mechanisms in amorphous dielectrics and multilayer capacitor structures with amorphous dielectrics, such as metal-insulator-semiconductor (MIS) structures with inorganic and organic semiconductors, as well as MOSFET transistors with high k dielectrics
Bibliography Includes bibliographical references and index
Subject Capacitors -- Materials.
Form Electronic book
ISBN 3319678701