Introduction -- Statistics -- Yield Statistics -- Area Dependence of the Yield -- Statistics of Embedded Object Fails -- Fail Commonalities -- Spatial Patterns -- Test Coverage and Test Fallout -- Logic Diagnosis -- Slat Based Diagnosis -- Data Collection Requirements -- Appendix A. Distribution of IC Fails -- Appendix B. General Yield Model -- Appendix C. Simplified Center-Satellite Model -- Appendix D. Quadrat Analysis -- Appendix E. Cell Fail Probabilities -- Appendix F. Characterization Group -- Appendix G. Component Fail Probabilities -- Appendix H. Yield and Coverage -- Appendix I. Estimating First Fail Probabilities from the Fallout -- Appendix J. Identity of M and S -- References -- Index
Summary
"The purpose of the book is to bring together in one place a large number of analysis, data mining and diagnosis techniques that have proven to be useful in analyzing IC fails. The descriptions of the techniques and analysis routines is sufficiently detailed that profession manufacturing engineers can implement them in their own work environment."--Jacket
