Title Characterization of microstructures by analytical electron microscopy (AEM) = Wei guan zu zhi de fen xi dian zi xian wei xue biao zheng / Yonghua Rong Characterization of microstructures by analytical electron microscopy (AEM) = 微观组织的分析电子显微学表征 / Yonghua Rong

Published Beijing : Higher Education Press ; Berlin ; New York : Springer, ©2012

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Description 1 online resource (xviii, 552 pages) : illustrations Contents Analytical Electron Microscope (AEM) -- Specimen Preparation -- Electron Diffraction -- Mathematics Analysis in Electron Diffraction and Crystallography -- Diffraction Contrast -- High Resolution and High Spatial Resolution of Analytical Electron Microscopy Analysis Surfaces (Physics) Materials Science Characterization and Evaluation of Materials Condensed Matter Physics Optics, Optoelectronics, Plasmonics and Optical Devices materialen materials materiaalkunde fysica physics optica optics Engineering (General) Techniek (algemeen) Bibliography Includes bibliographical references and index Subject Nanostructured materials -- Nondestructive testing Electron microscopy. electron microscopy. TECHNOLOGY & ENGINEERING -- Engineering (General) TECHNOLOGY & ENGINEERING -- Reference. Science des matériaux. Chimie. Electron microscopy Form Electronic book ISBN 9781461924869 1461924863 9783642201196 3642201199 3642201180 9783642201189 7040300923 9787040300925

Other Titles 880-03 Wei guan zu zhi de fen xi dian zi xian wei xue biao zheng 880-03/$1 微观组织的分析电子显微学表征

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