2006

Defects in high-k gate dielectric stacks : nano-electronic semiconductor devices

NATO Advanced Research Workshop on Defects in High-k Dielectric Nano-electronic Semiconductor Devices (2005 : Saint Petersburg, Russia)



 

2012

Defects-recognition imaging and physics in semiconductors XIV : selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, Sept

International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (2011 : Miyazaki, Japan)



 

2014

Gettering and defect engineering in semiconductor technology XV : selected papers from the 15th Gettering and Defect Engineering in Semiconductor Technology Conference, September 22-27, 2013, Oxford,

Gettering and Defect Engineering in Semiconductor Technology Conference (15th : 2013 : Oxford, Great Britain)

Durnten-Zurich : Trans Tech publications Ltd, [2014]

 

2002-

IEEE International Conference on Advanced Thermal Processing of Semiconductors : RTP

IEEE International Conference on Advanced Thermal Processing of Semiconductors

Piscataway, N.J. : IEEE, [2002-]

 

2004

Stress-induced phenomena in metallization : Seventh International Workshop on Stress-Induced Phenomena in Metallization, Austin, Texas, 14-16 June 2004

International Workshop on Stress-Induced Phenomena in Metallization (7th : 2004 : Austin, Tex.)

Melville, N.Y. : American Institute of Physics, 2004

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