Spectrum analysis -- Measurement. : Spectroscopic ellipsometry : practical application to thin film characterization / Harland G. Tompkins and James N. Hilfiker
Spectrum analyzers -- Design -- Mathematical models. : Advances in imaging and electron physics. Volume One Hundred and Ninety Two, Analytical, approximate-analytical and numerical methods in the design of energy analyzers / Victor S. Gurov, Arman O. Saulebekov, Andrey A. Trubitsyn ; translated by Mikhail A. Monastyrskiy
Wide continuum of associated cognitive and neurobehavioral disorders, including, but not limited to, three core-defining features: impairments in socialization, impairments in verbal and nonverbal communication, and restricted and repetitive patterns of behaviors. (from DSM-V)
Specular reflectance. : Specular gloss / edited by Raimo Silvennoinen, Kai-Erik Peiponen, Kari Myller
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Specular reflectance -- Congresses. : Review and evaluation of appearance : methods and techniques : a symposium sponsored by ASTM Committee E-12 on Appearance of Materials, Montreal, Canada, 23 May 1984 / J.J. Rennilson and W.N. Hale, Jr., editors