| Description |
1 online resource (xxi, 532 pages) : illustrations |
| Series |
Instrumentation and measurement series |
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Instrumentation and measurement series.
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| Contents |
880-01 Introduction; Chapter 1. Measurement Instrumentation; 1.1. General introduction and definitions; 1.2. The historical aspects of measurement; 1.3. Terminology: measurement, instrumentation and metrology; 1.4. MIM interactions: measurement-instrumentation-metrology; 1.5. Instrumentation; 1.6. Is a classification of instruments possible?; 1.7. Instrument modeling; 1.8. Characteristics of an instrument; 1.9. Implementing measurement acquisition; 1.10. Analyzing measurements obtained by an instrument; 1.11. Partial conclusion; 1.12. Electronic instrumentation |
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880-01/(S 1. Measurement Instrumentation -- 1.1. General introduction and definitions -- 1.2. The historical aspects of measurement -- 1.3. Terminology: measurement, instrumentation and metrology -- 1.4. MIM interactions: measurement-instrumentation-metrology -- 1.5. Instrumentation -- 1.6. Is a classification of instruments possible-- 1.6.1. Classification of instruments used in cars -- 1.7. Instrument modeling -- 1.7.1. Model of a measurement instrument -- 1.7.2. Load effects -- 1.7.3. Estimating load effects -- 1.7.4. Effort and flow variables -- 1.7.5. Features and operating points of a system -- 1.7.6. Generalized impedance -- 1.7.7. Determining the load effect -- 1.7.8. Measurement with a car battery -- 1.7.9. Determining impedances -- 1.7.10. Generalized admittance -- 1.8. Characteristics of an instrument -- 1.8.1. Components of static transfer functions -- 1.8.2. Dynamic characteristics -- 1.8.3. Instrument performance -- 1.8.4. Combining transfer functions -- 1.9. Implementing measurement acquisition -- 1.9.1. Principles and methodology of measurement -- 1.9.2. Field measurement constraints: instrumentation on the road -- 1.10. Analyzing measurements obtained by an instrument -- 1.10.1. Error reduction -- 1.10.2. Base definitions -- 1.11. Partial conclusion -- 1.12. Electronic instrumentation -- 1.13. Electronic instrumentation functionality -- 1.13.1. Programmable instrumentation -- 1.13.2. Example of an electronic instrument: how a piezoelectric sensor detects rattle in a combustion engine -- 1.14. The role of instrumentation in quality control -- 1.15. Conclusion -- 1.16. Appendix -- 1.17. Bibliography -- 2. General Principles of Sensors -- 2.1. General points -- 2.1.1. Basic definitions -- 2.1.2. Secondary definitions -- 2.2. Metrological characteristics of sensors -- 2.2.1. Systematic errors -- 2.2.2. Random uncertainties -- 2.2.3. Analyzing random errors and uncertainties -- 2.2.3.1. Evaluating random uncertainties. Standard deviations. Variances -- 2.2.3.2. Decisions about random uncertainties -- 2.2.3.3. Reliability, accuracy, precision -- 2.3. Sensor calibration -- 2.3.1. Simple calibration -- 2.3.2. Multiple calibration -- 2.3.3. Linking international measurement systems -- 2.4. Band pass and response time -- 2.4.1. Harmonic response -- 2.4.2. Response time -- 2.5. Passive sensor conditioners -- 2.5.1. The effect of polarization instabilities -- 2.5.2. Effects of influence variables -- 2.5.3. Conditioners of complex impedance sensors -- 2.6. Conditioners for active sensors -- 2.6.1. Direct reading -- 2.6.2. Using operational amplifiers -- 2.7. Bibliography -- 3. Physical Principles of Optical, Thermal and Mechanical Sensors -- 3.1. Optical sensors -- 3.1.1. Energetic flux -- 3.1.2. Luminous flux -- 3.1.3. The relative luminous efficiency curve V(λ) of the human eye -- 3.1.4. The black body: a reference for optical sensors -- 3.1.4.1. Black body radiation -- 3.1.4.2. Realization of black bodies -- 3.1.5. Radiation exchanges between a source and a detector -- 3.1.6. Definitions relating to optical sensors -- 3.1.6.1. Darkness currents -- 3.1.6.2. Spectral and total sensitivities -- 3.1.6.3. Sources of fundamental noise sources in optical sensors -- 3.1.6.4. Specific detectivity -- 3.1.7. Semiconductors: the bases of optical sensors -- 3.1.7.1. Molecular and crystalline bands -- 3.1.7.2. Band structures in solids -- 3.1.8. Current expression in a material containing free charges -- 3.1.9. Photoconductor cells -- 3.1.10. P-N junction and photodiodes -- 3.1.10.1. Non-polarized junctions -- 3.1.10.2. P-N junction with direct bias -- 3.1.10.3. P-N junction in reverse bias -- 3.1.10.4. Diode equation -- 3.1.10.5. Illuminated P-N junctions -- 3.1.10.6. Principle of photodiode fabrication -- 3.1.10.7. Photodiode equation -- 3.1.10.8. Electrical schema for a diode -- 3.2. Force and deformation sensors -- 3.2.1. Resistive gauges -- 3.2.2. Piezoelectric effect -- 3.2.2.1. Electrostriction, piezoelectricity and pyroelectricity -- 3.2.2.2. The case of quartz -- 3.2.2.3. Constraint tensors -- 3.2.2.4. Other piezoelectric materials -- 3.2.2.5. Construction of piezoelectric sensors -- 3.2.2.6. Using piezoelectric sensors -- 3.3. Thermal sensors -- 3.3.1. Concepts related to temperature and thermometry -- 3.3.2. Thermodynamic temperature -- 3.3.3. Temperature scales currently in use and widely used measurements -- 3.3.4. Heat transfers -- 3.3.4.1. Conduction -- 3.3.4.2. Convection -- 3.3.4.3. Radiation -- 3.3.4.4. Contact temperature measurement of solids -- 3.3.5. Contact thermometers -- 3.3.5.1. Resistive thermometers -- 3.3.5.2. The Seebeck effect -- 3.3.5.3. The Peltier effect -- 3.3.5.4. The Thomson effect -- 3.3.5.5. The Seebeck electromotive force -- 3.3.6. Features and uses of thermocouples -- 3.4. Bibliography -- 4. Analog Processing Associated with Sensors -- 4.1. Introduction -- 4.2. The problem of electronic noise -- 4.2.1. The origin of electronic noise -- 4.2.2. Noise in an electronic chain -- 4.2.3. Signal-to-noise ratio -- 4.3. Amplifiers -- 4.3.1. Operational amplifier -- 4.3.1.1. Feedback and counter-feedback in currents and tensions -- 4.3.1.2. Principle features of operational amplifiers -- 4.3.2. Instrumentation amplifiers -- 4.3.3. Isolation amplifiers -- 4.3.4. Logarithmic amplifiers -- 4.3.5. Multipliers -- 4.4. Bibliography |
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1.13. Electronic instrumentation functionality1.14. The role of instrumentation in quality control; 1.15. Conclusion; 1.16. Appendix; 1.17. Bibliography; Chapter 2. General Principles of Sensors; 2.1. General points; 2.2. Metrological characteristics of sensors; 2.3. Sensor calibration; 2.4. Band pass and response time; 2.5. Passive sensor conditioners; 2.6. Conditioners for active sensors; 2.7. Bibliography; Chapter 3. Physical Principles of Optical, Thermal and Mechanical Sensors; 3.1. Optical sensors; 3.2. Force and deformation sensors; 3.3. Thermal sensors; 3.4. Bibliography |
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Chapter 4. Analog Processing Associated with Sensors4.1. Introduction; 4.2. The problem of electronic noise; 4.3. Amplifiers; 4.4 Bibliography; Chapter 5. Analog Filters; 5.1. Introduction; 5.2. Technological constraints; 5.3. Methods of analog filter calculation; 5.4. Passive filter using inductors and capacitors; 5.5. Active filters; 5.6. Switched capacitor filters; 5.7. Bibliography; Chapter 6. Real-time Data Acquisition and Processing Systems; 6.1. Introduction; 6.2. Electronic devices for signal sampling and quantification; 6.3. Analog-to-digital converters |
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6.4. Real-time digital analysis by a specialized processor6.5. Conclusion; 6.6. Bibliography; Chapter 7. The Contribution of Microtechnologies; 7.1. Introduction; 7.2. Microtechnologies; 7.3. Electronic architectures and the effects of miniaturization; 7.4. Bibliography; Chapter 8. Instruments and Measurement Chains; 8.1. Measurement devices; 8.2. Measurement chains; 8.3. Bibliography; Chapter 9. Elaboration of Models for the Interaction Between the Sensor and its Environment; 9.1. Modeling a sensor's interactions with its environment; 9.2. Researching the parameters of a given model |
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9.3. Determining regression line coefficients9.4. Example of a polynomial relation; 9.5. A simple example; 9.6. Examples of multivariable models; 9.7. Dealing with constraints; 9.8. Optimizing the search for a polynomial model; 9.9. Bibliography; Chapter 10. Representation and Analysis of Signals; 10.1. Introduction; 10.2. Analog processing chain; 10.3. Digital processing chain; 10.4. Linear digital filtering; 10.5. Examples of digital processing; 10.6. Frequency, time, time-frequency and wavelet analyses; 10.7. A specific instance of multidimensional signals; 10.8. Bibliography |
| Summary |
Instrumentation and Measurement presents the general principles of instrumentation processes. The book explains the theoretical analysis of physical phenomena used by standard sensors and transducers to transform a physical value into an electrical signal. The preprocessing of these signals through electronic circuits - amplification, signal filtering and analogue to digital conversion - are then detailed, in order to provide useful basic information. The focus of the book moves on from elementary data to general complex systems. Topics covered include instrumentation and measurement chains, se |
| Bibliography |
Includes bibliographical references and index |
| Notes |
"First published in France in 2000 by Hermes Science Publications in two volumes entitled 'Mesure et instrumentation--T.p. verso |
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Print version record |
| Subject |
Measurement.
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Engineering instruments.
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Scientific apparatus and instruments.
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Detectors.
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measuring.
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scientific instruments.
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TECHNOLOGY & ENGINEERING -- Engineering (General)
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TECHNOLOGY & ENGINEERING -- Reference.
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Detectors
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Engineering instruments
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Measurement
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Scientific apparatus and instruments
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| Form |
Electronic book
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| Author |
Placko, Dominique
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| ISBN |
9781847045898 |
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1847045898 |
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9781118613641 |
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1118613643 |
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