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E-book
Author International Conference on Very Large Scale Integration (23rd : 2015 : Taej┼Ćn-si, Korea)

Title VLSI-SoC : design for reliability, security, and low power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised selected papers / Youngsoo Shin, Chi Ying Tsui, Jae-Joon Kim, Kiyoung Choi, Ricardo Reis (eds.)
Published Switzerland : Springer, 2016
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Description 1 online resource (xiii, 223 pages) : illustrations
Series IFIP advances in information and communication technology, 1868-4238 ; 483
IFIP advances in information and communication technology ; 483. 1868-4238
Summary This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems
Notes Includes author index
Online resource; title from PDF title page (SpringerLink, viewed September 26, 2016)
Subject Internet of things -- Congresses.
Integrated circuits -- Very large scale integration -- Congresses.
Genre/Form Conference papers and proceedings.
Conference papers and proceedings.
Form Electronic book
Author Shin, Youngsoo, editor
Tsui, Chi-Ying, editor
Kim, Chae-jun, 1901- editor
Choi, Kiyoung, editor
Reis, Ricardo, editor
ISBN 9783319460970 (electronic bk.)
3319460978 (electronic bk.)
(print)