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Book Cover
E-book
Author International Symposium for Testing and Failure Analysis (27th : 2001 : Santa Clara, Calif.)

Title ISTFA 2001 : proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California / sponsored by EDFAS
Published Materials Park, OH : ASM International, ©2001

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Description 1 online resource (xix, 485 pages) : illustrations
Contents Preface -- Table of Contents -- IPFA 2000 Best Paper Award Winner -- Session 1: Advanced Techniques 1 -- Session 2: Advanced Techniques 2 -- Session 3: Packaging -- Session 4: Poster Session -- Session 5: Backside 1 -- Session 6: SPM -- Session 7: Backside 2 -- Session 8: Case Histories 1 -- Session 9: FIB -- Session 10: Case Histories 2 -- Session 11: MEMS -- Session 12: Techniques -- Session 13: Yield Improvement -- Session 14: Discretes -- Session 15: Defect-Based Testing -- Index
Bibliography Includes bibliographical references and index
Notes Print version record
Subject Electronics -- Materials -- Testing -- Congresses
Electronic apparatus and appliances -- Testing -- Congresses
TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- General.
TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- Integrated.
Electronic apparatus and appliances -- Testing
Electronics -- Materials -- Testing
Genre/Form Conference papers and proceedings
Form Electronic book
Author ASM International.
Electronic Device Failure Analysis Society.
ISBN 9781615030859
1615030859
Other Titles Proceedings of the 27th International Symposium or Testing and Failure Analysis
Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis