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Author
International Symposium for Testing and Failure Analysis (27th : 2001 : Santa Clara, Calif.)
Title
ISTFA 2001 : proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California / sponsored by EDFAS
Published
Materials Park, OH : ASM International, ©2001
Click on the following:
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Description
1 online resource (xix, 485 pages) : illustrations
Contents
Preface -- Table of Contents -- IPFA 2000 Best Paper Award Winner -- Session 1: Advanced Techniques 1 -- Session 2: Advanced Techniques 2 -- Session 3: Packaging -- Session 4: Poster Session -- Session 5: Backside 1 -- Session 6: SPM -- Session 7: Backside 2 -- Session 8: Case Histories 1 -- Session 9: FIB -- Session 10: Case Histories 2 -- Session 11: MEMS -- Session 12: Techniques -- Session 13: Yield Improvement -- Session 14: Discretes -- Session 15: Defect-Based Testing -- Index
Bibliography
Includes bibliographical references and index
Notes
Print version record
Subject
Electronics -- Materials -- Testing -- Congresses
Electronic apparatus and appliances -- Testing -- Congresses
TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- General.
TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- Integrated.
Electronic apparatus and appliances -- Testing
Electronics -- Materials -- Testing
Genre/Form
Conference papers and proceedings
Form
Electronic book
Author
ASM International.
Electronic Device Failure Analysis Society.
ISBN
9781615030859
1615030859
Other Titles
Proceedings of the 27th International Symposium or Testing and Failure Analysis
Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis
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