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Title Structure determination from powder diffraction data / edited by W.I.F. David ... [and others]
Published Oxford ; New York : Oxford University Press, 2002

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Location Call no. Vol. Availability
 W'PONDS  548 Dav/Sdf  AVAILABLE
Description xvii, 337 pages : illustrations ; 24 cm
Series IUCr monographs on crystallography ; 13
International Union of Crystallography monographs on crystallography ; 13
Contents Machine derived contents note: List of Contributors -- 1. Introduction, William I. F. David, Kenneth Shankland, Lynne B. McCusker and Christian Baerlocher -- 2. Structure determination from powder diffraction data: an overview, Anthony K. Cheetham -- 3. Laboratory X-ray powder diffraction, Daniel Louer -- 4. Synchrotron radiation powder diffraction, Peter W. Stephens, David E. Cox and Andrew N. Fitch -- 5. Neutron powder diffraction, Richard M. Ibberson and William I. F. David -- 6. Sample preparation, instrument selection and data collection, Roderick J. Hill and Ian C. Madsen -- 7. Autoindexing, Per-Erik Werner -- 8. Extracting integrated intensities from powder diffraction patterns, William I. F. David and Devinderjit S. Sivia -- 9. Experimental methods for estimating the relative intensities of overlapping reflections, Thomas Wessels, Christian Baerlocher, Lynne B. McCusker and William I. F. David -- 10. Direct methods in powder diffraction - basic concepts, Rene Peschar, Anke Etz, Jouk Jansen and Hendrick Schenk -- 11. Direct methods in powder diffraction - applications, Carmelo Giacovazzo, Angela Altomare, Maria Christina Burla, Benedetta Carrozzini, Giovanni Luca Cascarano, Antonietta Guagliardi, Anna Grazia G. Moliterni, Giampiero Polidori and Rosanna Rizzi -- 12. Patterson methods in powder diffraction: maximum entropy and symmetry minimum function techniques, Michael A. Estermann and William I. F. David -- 13. Solution of Patterson-type syntheses with the Direct methods sum function, Jordi Ruis -- 14. A maximum entropy approach to structure solution, Christopher J. Gilmore, Kenneth Shankland and Wei Dong -- 15. Global optimisation strategies, Kenneth Shankland and William I. F. David -- 16. Solution of flexible molecular structures by simulated annealing, Peter G. Bruce and Yuri G. Andreev -- 17. Chemical information and intuition in solving crystal structures, Lynne B. McCusker and Christian Baerlocher -- Index of symbols -- Index of abbreviations -- Computer programs -- Index
Bibliography Includes bibliographical references and index
Subject X-ray crystallography.
Crystals -- Structure.
Powders -- Optical properties -- Measurement.
Author David, W. I. F. (William I. F.)
LC no. 2001047555
ISBN 0198500912 acid-free paper