| Description |
1 online resource |
| Series |
Springer series in surface sciences, 0931-5195 ; 51 |
|
Springer series in surface sciences ; 51
|
| Contents |
Macroscopic Techniques -- Contact Angle and Wetting Properties / Yuehua Yuan, T. Randall Lee -- Adsorption Calorimetry on Well-Defined Surfaces / Ole Lytken, Hans-Jörg Drescher, Rickmer Kose, J. Michael Gottfried -- Optical techniques -- Methods of IR Spectroscopy for Surfaces and Thin Films / David Allara, Josh Stapleton -- A Surface Scientist's View on Spectroscopic Ellipsometry / Maurizio Canepa -- Nonlinear Vibrational Spectroscopy / Lee J. Richter -- X ray Techniques -- Grazing Incidence X-Ray Diffraction / Osami Sakata, Masashi Nakamura -- X-Ray Reflectivity / A. Gibaud, M.S. Chebil, T. Beuvier -- Resonant Photoelectron Diffraction / Alberto Verdini, Peter Krüger, Luca Floreano -- Surface Structure Analysis with X-Ray Standing Waves / Jörg Zegenhagen -- Advanced Applications of NEXAFS Spectroscopy for Functionalized Surfaces / Alexei Nefedov, Christof Wöll -- Neutral Particle Techniques -- Neutron Reflectivity / Frédéric Ott -- Probing Surfaces with Thermal He Atoms: Scattering and Microscopy with a Soft Touch / Bodil Holst, Gianangelo Bracco -- The Helium Spin-Echo Method / Andrew Jardine -- Diffraction of H2 from Metal Surfaces / Daniel Farías, Marina Minniti, Rodolfo Miranda -- Charged Particle Techniques -- Low Energy Ion Scattering and Recoiling Spectroscopy in Surface Science / Vladimir A. Esaulov -- Helium Ion Microscopy / Diederik J. Maas, Raoul van Gastel -- High Resolution Electron Energy Loss Spectroscopy (HREELS): A Sensitive and Versatile Surface Tool / Luca Vattuone, Letizia Savio, Mario Rocca -- Low-Energy Electron Microscopy / Juan de la Figuera, Kevin F. McCarty -- Scanning Probe Techniques -- Scanning Tunneling Microscopy / Ada Della Pia, Giovanni Costantini -- Surface Characterization Using Atomic Force Microscopy (AFM) in Liquid Environments / Venetia D. Lyles, Wilson K. Serem, Jing-Jiang Yu, Jayne C. Garno -- Atomic Force Microscopy for Surface Imaging and Characterization of Supported Nanostructures -- Franciszek Krok, -- Bartosz Such, -- Jacek J. Kolodziej, -- Marek Szymonski |
| Summary |
The book describes the experimental techniques employed to study surfaces and interfaces. The emphasis is on the experimental method. Therefore all chapters start with an introduction of the scientific problem, the theory necessary to understand how the technique works and how to understand the results. Descriptions of real experimental setups, experimental results at different systems are given to show both the strength and the limits of the technique. In a final part the new developments and possible extensions of the techniques are presented. The included techniques provide microscopic as well as macroscopic information. They cover most of the techniques used in surface science |
| Analysis |
Physics |
|
Nanotechnology |
|
Surface and Interface Science, Thin Films |
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Measurement Science and Instrumentation |
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Optics, Optoelectronics, Plasmonics and Optical Devices |
|
Nanoscale Science and Technology |
| Bibliography |
Includes bibliographical references and index |
| Subject |
Surfaces (Technology)
|
|
Surfaces (Technology) -- Analysis.
|
|
Surfaces (Physics)
|
|
TECHNOLOGY & ENGINEERING -- Nanotechnology & MEMS.
|
|
Chimie.
|
|
Science des matériaux.
|
|
Surfaces (Physics)
|
|
Surfaces (Technology)
|
|
Surfaces (Technology) -- Analysis
|
| Form |
Electronic book
|
| Author |
Bracco, Gianangelo
|
|
Holst, Bodil
|
| ISBN |
9783642342431 |
|
3642342434 |
|
