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Title Properties of crystalline silicon / edited by Robert Hull
Published London : INSPEC, the Institution of Electrical Engineers, [1999]
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Description 1 online resource (xxvi, 1016 pages) : illustrations
Series EMIS datareviews series ; no. 20
EMIS datareviews series ; no. 20
Contents Melt growth / edited by T. Abe -- Epitacxial growth / edited by J.C. Bean -- Structural and mechanical properties / edited by A. George -- Thermal properties / edited by M.R. Brozel -- Surface properties and cleaning / edited by R.J. Nemanich -- Structural modelling / edited by M. Heggie -- Band structure / edited by R.J. Turton -- Electrical properties / edited by S.H. Jones -- Impurities in silicon / edited by S.J. Pearson -- Dopants in silicon / edited by K. Jones -- Defect levels in silicon / edited by H. Godfrey -- Optical properties / edited by D.E. Aspnes -- Photoconductivity and photogenerated carriers / edited by M. Willander -- Implantation/irradiation of silicon / edited by R. Elliman -- Gettering / edited by E.R. Weber -- Etching / edited by K.R. Williams -- Metal-silicon contacts / edited by L. Schowalter -- Silicon on insulator technology / edited by S.S. Iyer
Bibliography Includes bibliographical references and index
Notes Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. MiAaHDL
Print version record
Subject Silicon.
Form Electronic book
Author Hull, Robert, 1959-
INSPEC (Information service)
ISBN 0852969333
159124871X (electronic bk.)
9781591248712 (electronic bk.)