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Book Cover
E-book
Author Krishnaswamy, Smita

Title Design, analysis and test of logic circuits under uncertainty / Smita Krishnaswamy, Igor L. Markov, John P. Hayes
Published Dordrecht ; New York : Springer, ©2013

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Description 1 online resource
Series Lecture notes in electrical engineering, 1876-1100 ; v. 115
Lecture notes in electrical engineering ; v. 115.
Contents Probabilistic transfer matrices -- Computing with probabilistic transfer matrices -- Testing logic circuits for probabilistic faults -- Signature-Based reliability analysis -- Design for robustness -- Summary and extensions
Summary Integrated circuits (ICs) increasingly exhibit uncertain characteristics due to soft errors, inherently probabilistic devices, and manufacturing variability. As device technologies scale, these effects can be detrimental to the reliability of logic circuits. To improve future semiconductor designs, this book describes methods for analyzing, designing, and testing circuits subject to probabilistic effects. The authors first develop techniques to model inherently probabilistic methods in logic circuits and to test circuits for determining their reliability after they are manufactured. Then, theystudyerror-maskingmechanisms intrinsic to digital circuits and show how to leverage them to design more reliable circuits. The book describes techniques for: - Modeling and reasoning about probabilistic behavior in logic circuits, including a matrix-based reliability-analysis framework; - Accurate analysis of soft-error rate (SER) based on functional-simulation, sufficiently scalable for use in gate-level optimizations; - Logic synthesis for greater resilience against soft errors, which improves reliability using moderate overhead in area and performance; - Test-generation and test-compaction methods aimed at probabilistic faults in logic circuits that facilitate accurate and efficient post-manufacture measurement of soft-error susceptibility
Analysis Engineering
Computer hardware
Computer science
Logic design
Operating systems (Computers)
Systems engineering
Circuits and Systems
Performance and Reliability
Symbolic and Algebraic Manipulation
Bibliography Includes bibliographical references and index
Subject Logic circuits -- Design
Logic circuits -- Testing
Uncertainty (Information theory)
COMPUTERS -- Logic Design.
TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- Logic.
TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- VLSI & ULSI.
Ingénierie.
Logic circuits -- Design
Logic circuits -- Testing
Uncertainty (Information theory)
Form Electronic book
Author Markov, Igor L. (Igor Leonidovich), 1973-
Hayes, John P. (John Patrick), 1944-
LC no. 2012943638
ISBN 9789048196449
9048196442
9048196434
9789048196432