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2025
Molla, Tebeje
Rating:
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2024
New York : Routledge, 2024
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2024
Biholar, Ramona
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2024
Singapore : Springer, [2024]
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2023
Toronto ; Buffalo ; London : University of Toronto Press, 2023
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2023
Bowman, Kathryn
Rating:
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2023
Kang, Jatinder
Rating:
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2023
Varghese, N. V
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2023
Hallmark, Tyler
Rating:
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2023
Cham : Palgrave Macmillan, [2023]
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2023
Rudling, Emily S., author
Cham : Palgrave Macmillan, [2023]
Rating:
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2023
Cham : Springer, [2023]
Rating:
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2023
Gavazzi, Stephen M., author.
Second edition
Cham : Springer, [2023]
Rating:
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2023
Cham, Switzerland : Springer, [2023]
Rating:
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2023
Cham, Switzerland : Palgrave Macmillan, [2023]
Rating:
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2023
2nd edition
Cham : Springer, 2023
Rating:
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2023
Rauhut, Daniel, author
Cham : Palgrave Macmillan, [2023]
Rating:
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|
2023
Nakamura, Tamotsu, author
Singapore : Springer, [2023]
Rating:
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2023
Hartmann-Hirsch, Claudia, author
Wiesbaden : Springer VS, 2023
Rating:
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2023
International Conference on Dependability of Computer Systems (18th : 2023 : Brunów, Poland)
Cham : Springer, 2023
Rating:
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2023
Cham : Springer, [2023]
Rating:
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2023
Cambridge, United Kingdom ; New York, NY : Cambridge University Press, 2023
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2023
Rudolph, John L., 1964- author.
Oxford ; New York : Oxford University Press, [2023]
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2022
Barnes, Benjamin J
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2022
Bonello, Charmaine
Rating:
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2022
Gorard, Stephen
Rating:
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2022
Breslin, Tony
Rating:
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2022
Osabuohien, Evans
Rating:
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2022
Chen, Chunjin
Rating:
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2022
Leathers, Howard D
6th ed
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2022
Mendolia, Silvia
Rating:
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2022
First edition
Abingdon, Oxon ; New York, NY : Routledge, 2022
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2022
Howes, Stephen
Rating:
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2022
Hines, Erik M
Rating:
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2022
Blossfeld, Gwendolin Josephine, author
Opladen : Budrich Academic Press, 2022
Rating:
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2022
Donatelle, Becky
14th ed
Rating:
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2022
Cham, Switzerland : Palgrave Macmillan, 2022
Rating:
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2022
Singapore : Springer, [2022]
Rating:
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2022
Cham, Switzerland : Palgrave Macmillan, 2022
Rating:
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|
2022
Cham, Switzerland : Springer, [2022]
Rating:
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2022
Cham, Switzerland : Springer, 2022
Rating:
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2022
Cham : Springer, [2022]
Rating:
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2021
Bell, Charles, 1985- author.
Baltimore, Maryland : Johns Hopkins University Press, [2021]
Rating:
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2021
Abingdon, Oxon ; New York, NY : Routledge, 2021
Rating:
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2021
Wang, Meimei, author.
Leiden ; Boston : Brill, [2021]
Rating:
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