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 Very relevant titles entries 1-3 |
2023
Wijsen, Lisa D., 1991-
Cham : Springer, 2023
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2008
Harris, Peter (Peter R.)
3rd ed
Rating:
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2005
Kline, Theresa, 1960- author.
Thousand Oaks, Calif. : Sage Publications, [2005]
Rating:
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 Relevant titles entries 4-5 |
2023
Washington, DC : American Psychological Association, [2023]
Rating:
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 Other relevant titles entries 6-351 |
2025
Cham, Switzerland : Springer, [2025]
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2025
New York, NY : Oxford University Press, [2025]
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2024
First edition
Palm Bay, FL, USA ; Burlington, ON, Canada : Apple Academic Press ; Boca Raton, FL, USA ; Abingdon, Oxon, UK : CRC Press, 2024
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2024
Cham : Springer, 2024
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2024
Hutcheson, Adam T., author
Cham : Palgrave Macmillan, [2024]
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2024
Eid, Michael
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2024
Mellinger, Christopher D
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2024
Psychometric Society. Annual Meeting (88th : 2023 : College Park, Md.)
Cham : Springer, 2024
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2023
Gordon, Rachel A., author.
Cambridge, United Kingdom ; New York, NY : Cambridge University Press, 2023
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2023
Cambridge, United Kingdom ; New York, NY, USA : Cambridge University Press, 2023
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2023
Cole, Veronica T., author
Cambridge, United Kingdom ; New York, NY : Cambridge University Press, 2023
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2023
Runco, Mark A.
Third edition
Amsterdam : Academic Press, 2023
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2023
Hallowell, Brooke, author
Second edition
San Diego, CA : Plural Publishing, Inc., [2023]
Rating:
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2023
Runco, Mark A
3rd ed
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2023
Howarth, Joan W., author.
Stanford, California : Stanford University Press, [2023]
Rating:
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2022
Wind, Stefanie A. (Anne), author.
First edition
[Place of publication not identified] : Chapman and Hall/CRC, 2022
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2022
Cambridge, United Kingdom ; New York, NY : Cambridge University Press, 2022
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2022
Mercado, Alfonso
Rating:
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2022
Howarth, Joan
Rating:
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2022
Jewell, Vanessa D., author
North Bethesda, MD : AOTA Press, [2022]
Rating:
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2022
Cham, Switzerland : Springer, 2022
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2022
Cham, Switzerland : Springer, 2022
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2022
Sato, Mine, author
Singapore : Palgrave Macmillan, 2022
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2022
Psychometric Society. Annual Meeting (86th : 2021 : Online)
Rating:
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2022
Sherman, Elisabeth M. S., author
Fourth edition
New York, NY : Oxford University Press, [2022]
Rating:
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2022
New York, NY : Oxford University Press, [2022]
Rating:
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2021
Cambridge : Cambridge University Press, 2021
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2021
Irribarra, David Torres
Rating:
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2021
Lyons, Thomas S.
Cham : Palgrave Macmillan, 2021
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2021
Giacomucci, Scott, author
Singapore : Springer, [2021]
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2021
Psychometric Society. Annual Meeting (85th : 2020 : Online)
Rating:
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2021
Cham : Palgrave Macmillan, 2021
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2021
Eye, Alexander von, author.
Berlin : Springer, [2021]
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2021
Bateson, Melissa, author
Fourth edition / Paul Martin, Melissa Bateson
Cambridge : Cambridge University Press, 2021
Rating:
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2021
Wells, Craig, 1970- author.
Cambridge, United Kingdom ; New York, NY : Cambridge University Press, 2021
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2021
1st ed. 2021
Cham : Springer International Publishing, 2021
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2021
Cambridge, United Kingdom ; New York, NY : Cambridge University Press, 2021
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2020
Charlotte, NC : Information Age Publishing, Inc., [2020]
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2020
Cambridge, United Kingdom ; New York, NY : Cambridge University Press, 2020
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2020
International Conference on Questionnaire Design, Development, Evaluation, and Testing (2nd : 2016 : Miami, Fla.), author.
Hoboken, NJ : John Wiley & Sons, Inc., 2020
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2020
Lamiell, James T
Rating:
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2020
Quirk, Thomas J., author.
2nd ed. 2020
Cham : Springer, 2020
Rating:
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