| Description |
1 online resource |
| Contents |
Front Cover; Theory and Modeling of Cylindrical Nanostructures for High-Resolution Coverage Spectroscopy; Dedication; Theory and Modeling of Cylindrical Nanostructures for High-Resolution Coverage SpectroscopyStefano BottacchiFrancesca Bottacchi; Copyright; Contents; Authors' Profile; Preface; Acknowledgments; 1 -- INTRODUCTION AND PHYSICAL BACKGROUND; 1. INTRODUCTION AND MOTIVATION; 2. BOOK OUTLINE; 3. ATOMIC FORCE MICROSCOPY; 3.1 OPERATING PRINCIPLE; 3.2 OPERATING MODES; 3.3 OTHER SCANNING PROBE MICROSCOPIC TECHNIQUES; 4. CARBON NANOTUBES; 4.1 CRYSTALLINE STRUCTURE |
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4.2 SYNTHESIS AND PROCESSING METHODS4.2.1 Sorting Techniques; 4.2.1.1 The Polymer Sorting Method; 5. CHARACTERIZATION OF CARBON NANOTUBE SAMPLES; 6. SILVER NANOWIRES; REFERENCES; 2 -- THE COVERAGE THEORY AND THE DELTA MODEL APPROXIMATION; 1. A SIMPLIFIED PHYSICAL MODEL; 1.1 STATISTICAL DISTRIBUTIONS OF THE SIO2 HEIGHT; 1.1.1 The Gaussian Fit; 1.2 STATISTICAL DISTRIBUTIONS OF THE CARBON NANOTUBE HEIGHT; 1.2.1 Coverage; 1.3 THE TOTAL HEIGHT STATISTIC OF THE DELTA MODEL; 1.3.1 Low SiO2 Roughness; 1.3.2 Large SiO2 Roughness; 1.3.3 The Coverage Equation |
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1.3.4 Limiting SiO2 Roughness and Interpeak Interference1.3.5 Comparison Between Substrate Roughness and Diameter; 2. SIMULATIONS; 2.1 SIO2 DENSITY MODEL; 2.2 CASE 1: LOW SIO2 ROUGHNESS; 2.3 CASE 2: LARGE SIO2 ROUGHNESS; 3. THE COVERAGE ERROR THEORY; 3.1 INTERPEAK INTERFERENCE ERROR; 3.2 MEASURED PEAK AMPLITUDE; 3.3 MEASURED COVERAGES; 3.4 APPROXIMATE COVERAGE ERRORS FOR Q≈1; 3.4.1 First Peak (Uncoverage) Error; 3.4.2 Single-Layer Carbon Nanotube Coverage Error; 3.4.3 Dual-Layer Carbon Nanotube Coverage Error; 3.4.4 Three-Layer Carbon Nanotube Coverage Error |
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3.5 THE COVERAGE SOLUTION ALGORITHM3.6 SIMULATION AND NUMERICAL VERIFICATION; 3.7 COMMENTS; 4. EXPERIMENTAL VERIFICATION: PART I; 4.1 IMPLEMENTING THE COVERAGE SOLUTION ALGORITHM; 4.2 SOMETHING IS MISSING; 5. A MODEL FOR MULTIPLE CARBON NANOTUBE INTERSECTIONS; 5.1 MULTIPLE CARBON NANOTUBES TRIPLETS; 5.2 GENERALIZATION OF THE CARBON NANOTUBE HEIGHT STATISTIC; 5.3 STATISTICAL MODEL OF THE CARBON NANOTUBE TRIPLET HEIGHT; 5.3.1 Mean; 5.3.2 Variance; 5.3.3 Density Function; 5.4 GENERALIZED STATISTIC OF THE CARBON NANOTUBE HEIGHT; 5.4.1 Conditional Probability of the Carbon Nanotube Triplet |
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5.5 PROBABILITY DENSITY OF THE TOTAL HEIGHT5.5.1 Convolution Theorems; Shift Theorem; [T2] Mean Value Theorem; [T3] Variance Theorem; 5.6 GAUSSIAN CONVOLUTION WITH THE CARBON NANOTUBE TRIPLET DENSITY; 5.6.1 Mean; 5.6.2 Variance; 5.6.3 Gaussian Approximation; 6. GENERALIZED COVERAGE THEORY; 6.1 THE FIRST SET OF INTERPEAK INTERFERENCE TERMS; 6.2 THE FIRST SET OF COVERAGE EQUATIONS; 6.3 THE SECOND SET OF INTERPEAK INTERFERENCE TERMS; 6.4 THE SECOND SET OF COVERAGE EQUATIONS; 6.4.1 Coverage Coefficients of the Carbon Nanotube Triplets; 6.5 MATRIX REPRESENTATION AND SOLUTION ALGORITHM |
| Summary |
Annotation Theory and Modeling of Cylindrical Nanostructures for High-Resolution Coverage Spectroscopy presents a new method for the evaluation of the coverage distribution of randomly deposited nanoparticles, such as single-walled carbon nanotubes and Ag nanowires over the substrate (oxides, SiO2, Si3N4, glass etc.), through height measurements performed by scanning probe microscopy techniques, like Atomic Force Microscopy (AFM). The deposition of nanoparticles and how they aggregate in multiple layers over the substrate is one of the most important aspects of solution processed materials determining device performances. The coverage spectroscopy method presented in the book is strongly application oriented and has several implementations supporting advanced surface analysis through many scanning probe microscopy techniques. Therefore this book will be of great value to both materials scientists and physicists who conduct research in this area. Demonstrates how to measure quantitatively the composition of coverage of nanoparticles, exploiting the distribution of the nanoparticles into several aggregatesExplains the method for evaluation of the coverage distribution of a substrate by randomly deposited nanoparticles utilizing experimental data provided by scanning probe microscopy techniquesExplains how the methods outlined can be used for a range of spectroscopy applicationsProvides great value to both materials scientists and physicists who conduct research in the modeling of cylindrical nanostructures |
| Notes |
Includes index |
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Online resource; title from PDF title page (EBSCO, viewed June 9, 2017) |
| Subject |
Nanostructured materials -- Spectra
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High resolution spectroscopy.
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TECHNOLOGY & ENGINEERING -- Engineering (General)
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TECHNOLOGY & ENGINEERING -- Reference.
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High resolution spectroscopy
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Nanostructured materials -- Spectra
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| Form |
Electronic book
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| Author |
Bottacchi, Francesca, author
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| ISBN |
9780323527323 |
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0323527329 |
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