Description |
1 online resource : illustrations |
Series |
Royal microscopical society-Wiley series |
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RMS-Wiley series.
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Contents |
Introduction to the Theory and Advantages of Low Voltage Electron Microscopy / David C Bell, Natasha Erdman -- SEM Instrumentation Developments for Low kV Imaging and Microanalysis / Natasha Erdman, David C Bell -- Extreme High-Resolution (XHR) SEM Using a Beam Monochromator / Richard J Young, Gerard N A van Veen, Alexander Henstra, Lubomir Tuma -- The Application of Low-Voltage SEM : From Nanotechnology to Biological Research / Natasha Erdman, David C Bell -- Low Voltage High-Resolution Transmission Electron Microscopy / David C Bell -- Gentle STEM of Single Atoms: Low keV Imaging and Analysis at Ultimate Detection Limits / Ondrej L Krivanek, Wu Zhou, Matthew F Chisholm, Juan Carlos Idrobo, Tracy C Lovejoy, Quentin M Ramasse, Niklas Dellby -- Low Voltage Scanning Transmission Electron Microscopy of Oxide Interfaces / Robert Klie -- What's Next? The Future Directions in Low Voltage Electron Microscopy / David C Bell, Natasha Erdman |
Summary |
"Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing. It serves as a guide for current and new microscopists and materials scientists who are active in the field of nanotechnology, and presents applications in nanotechnology and research of surface-related phenomena, allowing researches to observe materials as never before"-- Provided by publisher |
Bibliography |
Includes bibliographical references and index |
Notes |
Print version record |
Subject |
Electron microscopy -- Technique.
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Electron microscopy -- Technique
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Form |
Electronic book
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Author |
Bell, D. C. (David C.)
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Erdman, Natasha
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LC no. |
2012033919 |
ISBN |
9781118498514 |
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1118498518 |
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9781118498507 |
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111849850X |
|
9781118498484 |
|
1118498488 |
|
111997111X |
|
9781119971115 |
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