| Description |
1 online resource |
| Contents |
Front Cover; ATOM PROBE TOMOGRAPHY#; ATOM PROBE TOMOGRAPHY PUT THEORY INTO PRACTICEED; Copyright; CONTENTS; CONTRIBUTORS; PREFACE; LIST OF ABBREVIATIONS; One -- Early Developments and Basic Concepts; Two -- Field Ion Emission Mechanisms; Three -- Basics of Field Ion Microscopy; Four -- Atom Probe Sample Preparation; Five -- Time-of-Flight Mass Spectrometry and Composition Measurements; Six -- Atom Probe Tomography: Detector Issues and Technology; Seven -- Three-Dimensional Reconstruction in Atom Probe Tomography: Basics and Advanced Approaches; Eight -- Laser-Assisted Field Evaporation |
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Nine -- Data MiningTen -- Correlative Microscopy by (Scanning) Transmission Electron Microscopy and Atom Probe Tomography; Eleven -- Combining Atom Probe Tomography and Optical Spectroscopy; A; B; INDEX; Back Cover; INTRODUCTION; ATOM PROBE TOMOGRAPHY IN MATERIALS SCIENCE TODAY; BASIC CONCEPTS; CONCLUDING REMARKS, THE SPECIFICITIES OF ATOM PROBE TOMOGRAPHY; REFERENCES; INTRODUCTION; FIELD GENERATION AT THE SURFACE OF A FIELD EMITTER; FIELD EMISSION AT THE TIP SURFACE FROM ELECTRON EMISSION TO FIELD EVAPORATION; TRAJECTORIES OF IONS AFTER IONIZATION OR FIELD EVAPORATION IN THE ATOM PROBE |
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Conclusionreferences; introduction; basic principles; field ion microscopy in materials science; conclusion; references; specimen preparation by electropolishing; sample preparation using focused ion beam milling; conclusions; references; introduction; general concepts and definitions; optimizing the mass spectrum in atom probe tomography; extracting information from mass spectra; references; introduction; microchannel plate assembly; conventional delay line detector; conventional measure of timing information; accuracy of conventional delay line detector for single events |
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Coevaporation effectaccuracy of conventional delay line detector for multiple events; advanced delay line detector; influence of detection systems performances on low-angle atom probe accuracy; influence of detection systems on atom probe accuracy in wide-angle ap; effect of multiple events detection on composition; conclusion; references; classical methods of tomographic reconstruction; a few words on metrological performances and terminology; spatial precision; improving spatial accuracy of apt images; conclusions and perspectives; references; introduction |
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Historical background of field evaporation assisted by laser pulsesoptical properties of nano tips; physical mechanisms of field evaporation assisted by laser pulses; consequences on the la-apt performances; conclusions and perspectives; references; preliminary definitions; building the tools; relevance of the approach as a function of the feature of interest; identifying the bias; conclusion; references; motivations for a correlative approach; relevant techniques for a correlative approach; experimental protocols; degradation of specimen due to observation in stem |
| Notes |
Includes index |
| Bibliography |
Includes bibliographical references at the end of each chapters and index |
| Notes |
Print version record |
| Subject |
Tomography.
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TECHNOLOGY & ENGINEERING -- Engineering (General)
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TECHNOLOGY & ENGINEERING -- Reference.
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Tomography
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| Form |
Electronic book
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| Author |
Lefebvre-Ulrikson, Williams
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Vurpillot, François
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Sauvage, Xavier
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| ISBN |
0128047453 |
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9780128047453 |
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