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Author Behl, Akhil, author.

Title CompTIA data+ DA0-001 / Akhil Behl, Siva G. Subramanian
Published [Indianapolis, Indiana] : Pearson Education, Inc., [2023]


Description 1 online resource (1 volume.) : illustrations
Series Exam CRAM
Exam cram (Pearson Education, Inc.)
Summary CompTIA® Data+ DA0-001 Exam Cram is an all-inclusive study guide designed to help you pass the CompTIA Data+ DA0-001 exam. Prepare for test day success with complete coverage of exam objectives and topics, plus hundreds of realistic practice questions. Extensive prep tools include quizzes, Exam Alerts, and our essential last-minute review CramSheet. The powerful Pearson Test Prep practice software provides real-time assessment and feedback with two complete exams
Notes Includes index
Description based on print version record
Subject Computing Technology Industry Association -- Examinations -- Study guides
Computing Technology Industry Association.
Electronic data processing -- Examinations -- Study guides
Electronic data processing personnel -- Certification -- Examinations -- Study guides
Electronic data processing -- Examinations.
Genre/Form Study guides.
Form Electronic book
Author Subramanian, Siva G., author