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Title Power-aware testing and test strategies for low power devices / edited by Patrick Girard, Nicola Nicolici and Xiaoqing Wen
Published New York ; London : Springer, 2009


Description 1 online resource
Contents Introduction.-Fundamentals of VLSI Testing.-Power Issues During Test.-Low-Power Test Pattern Generation.-Power-Aware Design-for-Test.-Power-Aware BIST and Test Data Compression.-Power-Aware System-Level Test Planning -- Low Power Design Techniques and Test Implications.-Test Strategies for Multi-Voltage Designs.-Test Strategies for Gated Clock Designs -- Test of Power Management Structures.-EDA Solutions for Power-Aware Design-for-Test
Summary Power-Aware Testing and Test Strategies for Low-Power Devices Edited by: Patrick Girard, Research Director, CNRS / LIRMM, France Nicola Nicolici, Associate Professor, McMaster University, Canada Xiaoqing Wen, Professor, Kyushu Institute of Technology, Japan Managing the power consumption of circuits and systems is now considered as one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low-power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and Electronic Design Automation (EDA) solutions for testing low-power devices. The first comprehensive book on power-aware test for (low-power) circuits and systems Shows readers how low-power devices can be tested safely without affecting yield and reliability Includes necessary background information on design-for-test and low-power design Covers in detail power-constrained test techniques, including power-aware automatic test pattern generation, design-for-test, built-in self-test and test compression Presents state-of-the-art industrial practices and EDA solutions
Bibliography Includes bibliographical references and index
Notes Print version record
Subject Low voltage integrated circuits -- Power supply
Low voltage integrated circuits -- Testing
TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- Integrated.
TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- General.
Low voltage integrated circuits -- Power supply.
Low voltage integrated circuits -- Testing.
TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- Integrated.
TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- General.
Form Electronic book
Author Girard, Patrick, Ph. D.
Nicolici, Nicola.
Wen, Xiaoqing.
LC no. 2009930470
ISBN 9781441909282