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E-book

Title The ELFNET book on failure mechanisms, testing methods, and quality issues of lead-free solder interconnects / Günter Grossmann, Christian Zardini, editors
Published London ; New York : Springer, ©2011

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Description 1 online resource (viii, 313 pages) : illustrations
Contents 1. Deformation and Fatigue of Solders -- 2. Factors Affecting the Bulk Embrittlement of Pb-Free Solder Joints -- 3. Thermal Fatigue Analysis -- 4. Electrochemical Behavior of Solder Alloys -- 5. Void Formation by Kirkendall Effect in Solder Joints -- 6. Tin Whiskers -- 7. Electromigration in Solder Interconnects -- 8. Impact of Black Pad and Intermetallic Layers on the Risk for Fractures in Solder Joints to Electroless Nickel/Immersion Gold -- 9. Reliability of Electronic Assemblies under Mechanical Shock Loading -- 10. Impact of Humidity and Contamination on Surface Insulation Resistance and Electrochemical Migration -- 11. Lead Free and Other Process Effects on Conductive Anodic Filamentation (CAF) Resistance of Glass Reinforced Epoxy Laminates -- 12. PCB Delamination -- 13. Excessive Warpage of Large Packages during Reflow Soldering -- 14. Popcorn Cracking -- 15. Thermal Capability of Components
Summary The ELFNET Book on Failure Mechanisms, Testing Methods, and Quality Issues of Lead-Free Solder Interconnects is the work of the European network ELFNET which was founded by the European Commission in the 6th Framework Programme. It brings together contributions from the leading European experts in lead-free soldering. The limited validity of testing methods originating from tin-lead solder was a major point of concern in ELFNET members' discussions. As a result, the network's reliability group decided to bring together the material properties of lead-free solders, as well as the basics of material science, and to discuss their influence on the procedures for accelerated testing. This has led to a matrix of failure mechanisms and their activation and, as a result, to a comprehensive coverage of the scientific background and its applications in reliability testing of lead-free solder joints. The ELFNET Book on Failure Mechanisms, Testing Methods, and Quality Issues of Lead-Free Solder Interconnects is written for scientists, engineers and researchers involved with lead-free electronics
Analysis engineering
elektronica
electronics
instrumentatie
instrumentation
optische instrumenten
optical instruments
kwaliteitscontroles
quality controls
materialen
materials
optica
optics
materiaalkunde
materials science
Engineering (General)
Techniek (algemeen)
Bibliography Includes bibliographical references
Notes Print version record
Subject Solder and soldering -- Fatigue
Fracture mechanics.
Ingénierie.
Fracture mechanics
Form Electronic book
Author Grossmann, Günter.
Zardini, Christian.
ISBN 9780857292360
0857292366
0857292358
9780857292353