Limit search to available items
Book Cover

Title Fakebusters II : scientific detection of fakery in art and philately / edited by Richard J. Weiss and Duane Chartier
Published Singapore ; Hackensack, N.J. : World Scientific, ©2004


Description 1 online resource (x, 317 pages) : illustrations (some color)
Series Series in popular science ; v. 4
Series in popular science ; v. 4.
Contents Table of Contents; 1. Preface; 2. R.W. WOOD: FAKEBUSTER EXTRAORDINAIRE; 3. Art Fakes and the Statue of Limitations; 4. Determination of Authenticity of Engraved Scrimshaw; 5. SCIENTIFIC DETECTION OF PHILATELIC FORGERIES; 6. Insurability of Art; 7. DNA as a Security Marker; 8. Authentication at a Small Museum: the Kindness of Strangers; 9. ART IN TRANSIT: INTERNATIONAL TRANSPORTATION OF FINE ART; 10. The Use of Raman Spectroscopy in the Art World; 11. Fakes, Forgeries, and Experts (FFE); 12. Madame Curie; 13. Non-Destructive Analysis of Artifacts by Using XRF, FTIR, and SEM/EDX
Summary Now that the sale of a Picasso painting has exceeded US $100 million at auction, the forgers are extricating their bag of tricks. This fascinating collection of papers provides an eclectic coverage of the art and philatelic concerns in safeguarding the integrity of creative artists. It paints a broader swath of the problems in art authentication, including philatelic fraud. The articles represent 24 expert contributions on relevant topics pertaining to the scientific detection of forgery in art and philately
Notes "Based on the proceedings of the symposium held at Photonics East 1999 [in Boston on September 20-21, 1999], sponsored by SPIE, the International Optical Engineering Society, Bellingham, WA 98227-0010, USA; ICAI, the International Center for Art Intelligence, Culver City, CA 90230-5109, USA; FFE, Fakes, Forgeries, and Experts, Castagnola, CH-6976, Switzerland."
Bibliography Includes bibliographical references
Notes English
Print version record
Subject Art -- Forgeries -- Congresses
Art -- Radiography -- Congresses
Art -- Expertising -- Congresses
Expertising, X-ray -- Congresses
Science and the arts -- Congresses
Art and science -- Congresses
TRAVEL -- Museums, Tours, Points of Interest.
BUSINESS & ECONOMICS -- Museum Administration & Museology.
REFERENCE -- General.
Art and science
Art -- Expertising
Art -- Forgeries
Art -- Radiography
Expertising, X-ray
Science and the arts
Wetenschappelijke technieken.
Genre/Form proceedings (reports)
Conference papers and proceedings
Conference papers and proceedings.
Actes de congrès.
Form Electronic book
Author Weiss, Richard J. (Richard Jerome), 1923-
Chartier, Duane R
Society of Photo-Optical Instrumentation Engineers
International Center for Art Intelligence.
Philatelic Fakes Forgeries and Experts
ISBN 9812701370
Other Titles Scientific detection of fakery in art and philately