Deakin University / All Locations

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Subjects (1-5 of 5)
Semiconductors -- Failures.
1 2005 Data mining and diagnosing IC fails Huisman, Leendert M Rating: Electronic Resources More...
2 2014 Electrical overstress (EOS) : devices, circuits, and systems Voldman, Steven H Chichester, West Sussex, United Kingdom : John Wiley & Sons Inc., 2014 Rating: Electronic Resources
3 2009 ESD : Failure Mechanisms and Models Voldman, Dr. Steven H Rating: Electronic Resources
4 1992 Theory of CMOS digital circuits and circuit failures Shoji, Masakazu, 1936- author. Princeton, New Jersey : Princeton University Press, [1992] Rating: Electronic Resources
5 2010 Wire bonding in microelectronics Harman, George G. 3rd ed Rating: Electronic Resources
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Data mining and diagnosing IC fails