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Materials -- Microscopy.
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2010
Briggs, Andrew.
2nd ed
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2002
ShindÅ, D. (Daisuke), 1953-
Tokyo ; London : Springer, [2002]
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2012
Mittal, Vikas
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2006
Berlin ; London : Springer, 2006
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2000
New York ; London : Kluwer Academic, [2000]
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2009
Second edition
New York, NY : Springer, [2009]
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1997
Weinheim ; New York : VCH, [1997]
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2008
Spence, John C. H
3rd ed
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2003
New York ; London : Springer, 2003
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2013
International Congress and Exhibition on Experimental and Applied Mechanics (12th : 2012 : Costa Mesa, Calif.)
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1975
Bowen, D. Keith (David Keith), 1940-
London [etc.] : MacMillan, 1975
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2002
Clarke, A. R. (Ashley Reginald), 1947-
Boca Raton, FL : CRC Press ; Cambridge, UK : Woodhead Publishing, 2002
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2002
Clarke, A. R. (Ashley Reginald), 1947-
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2008
Brandon, D. G.
Second edition
Chichester, England : John Wiley, 2008
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2005
NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication, and Device Application of Functional Materials (2002 : Algarve, Portugal)
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2014
Yablon, Dalia G
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2024
First edition
Boca Raton : CRC Press, Taylor & Francis Group, 2024
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2014
Bauer, Ernst, author
New York, NY : Springer, 2014
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2024
Yapp, Kehn E., author
Cham : Springer, [2024]
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2009
Williams, David B. (David Bernard), 1949-
2nd ed
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2001
Fultz, B. (Brent)
Berlin ; New York : Springer, 2001
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2008
Fultz, B. (Brent)
3rd ed
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2013
Fultz, B. (Brent)
4th ed. 2013
Berlin, Heidelberg : Springer Berlin Heidelberg, 2013 : Imprint Springer
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