| Description |
1 online resource (xv, 176 pages) : illustrations |
| Series |
Tutorial texts in optical engineering ; v. TT 39 |
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SPIE tutorial texts ; TT39
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| Contents |
1. Introduction -- Description of a sampled imager -- Description of the sampling process -- Linearity and shift invariance -- Signal reconstruction -- Three ways of viewing the sampling process |
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2. Fourier integral representation of an optical image -- Linear, shift-invariant optical systems -- Spatial and frequency domain filters -- Reducing LSI imager analysis to one dimension -- The MTF associated with typical imager components -- Temporal filters |
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3. Sampled imager response function -- Fourier transform of a sampled image -- Derivation of the sampled imager response function -- Examples of sampled imager response functions -- Definition and calculation of the spurious response ratio |
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4. Sampled imager design and optimization -- Interpolation and image reconstruction -- Classical design criteria for sampled imaging systems -- Minimum resolvable temperature difference, minimum resolvable contrast, and the half-sample limit -- MTF squeeze -- Sampled imager optimization |
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5. Interlace and dither -- Sampling improvement with static scene -- Resolution and sensitivity -- Effect of scene to sensor motion |
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6. Dynamic sampling, resolution enhancement, and super resolution, contributed by Jonathon M. Schuler and Dean A. Scribner -- Introduction -- Sampling limitations of the focal plane array topology -- Dynamic sampling -- Ambient optical flow as a novel sampling mechanism -- Image restoration -- Conclusion |
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7. The Sampling Theorem -- Theory -- Example -- Discussion |
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8. Laboratory measurements of sampled infrared imaging system performance -- Classical infrared imager performance measurements -- Sampled infrared imager performance measurements -- Appendix A: Fourier series and Fourier integrals -- Fourier series -- Fourier integral -- Appendix B: The impulse function -- Definition -- Properties of the impulse function |
| Summary |
Advances in solid state detector arrays, flat panel displays, and digital image processing have prompted an increasing variety of sampled imaging products and possibilities. These technology developments provide new opportunities and problems for the design engineer and system analyst--this tutorial's intended reader |
| Notes |
"SPIE digital library." |
| Bibliography |
Includes bibliographical references and index |
| Subject |
Imaging systems -- Image quality.
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Image processing -- Statistical methods
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Fourier analysis.
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Sampling (Statistics)
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Fourier Analysis
|
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Fourier analysis
|
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Image processing -- Statistical methods
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Imaging systems -- Image quality
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Sampling (Statistics)
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| Form |
Electronic book
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| Author |
Driggers, Ronald G.
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|
Society of Photo-Optical Instrumentation Engineers
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| ISBN |
9780819499950 |
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0819499951 |
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9780819478580 |
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081947858X |
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