Accelerating receiver jitter tolerance testing on ATE -- Transmitter jitter extractions on ATE -- Testing HSSIs with or without ATE instruments -- BER testing under noise
Summary
High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive instruments. "Accelerating Test, Validation and Debug of High Speed Serial Interfaces" provides innovative test and debug approaches and detailed instructions on how to arrive to practical test of modern high-speed interfaces. "Accelerating Test, Validation and Debug of High Speed Seria
