Thin film devices -- Defects -- Congresses. : Stress-induced phenomena in metallization : Seventh International Workshop on Stress-Induced Phenomena in Metallization, Austin, Texas, 14-16 June 2004 / editors, Paul S. Ho [and others]
Thin films -- Measurement : Spectroscopic ellipsometry : practical application to thin film characterization / Harland G. Tompkins and James N. Hilfiker
Thin films -- Properties -- Congresses : Thin film nanophotonics : conclusions from the third International Workshop on Thin Films for Electronics, Electro-optics, Energy and Sensors (TFE3S) / edited by Guru Subramanyam, Partha Banerjee, Karl Gudmundsson, Akhlesh Lakhtakia
2021
1
Thin films (San Diego, Calif.) -- Indexes : Thin films : author and subject cumulative index including tables of contents, vols. 1-24 / preface by Stephen M. Rossnagel ; indexes compiled by Janet Perlman
1998
1
Thin films -- Size effects. : From gold nano-particles through nano-wire to gold nano-layers / V. Švorčík, Z. Kolská, P. Slepička and V. Hnatowic
2010
1
Thin films -- Spectra : Waveguide spectroscopy of thin films / Alexander V. Khomchenko
Thin films -- Surfaces -- Magnetic properties : Magnetism of surfaces, interfaces, and nanoscale materials. Volume 5 / edited by Robert E. Camley, Zbigniew Celinski, Robert L. Stamps
2016
1
Thin films -- Surfaces -- Research -- Congresses : Mechanical properties of materials from nano to micro/meso-scale : selected, peer reviewed papers from the Local Mechanical Properties (LMP 2014), November 12-14, 2014, High Tatras, Slovak Republic / edited by Alexandra Kovalčíková and František Lofaj