| Description |
xviii, 678 pages : illustrations ; 25 cm |
| Contents |
1. Properties of X-rays -- 2. Geometry of crystals -- 3. Diffraction I: geometry -- 4. Diffraction II: intensities -- 5. Diffraction III: real samples -- 6. Diffractometer measurements -- 7. Powder photographs -- 8. Laue photographs -- 9. Phase identification by X-ray diffraction -- 10. Determination of crystal structure -- 11. Phase-diagram determination -- 12. Quantitative phase analysis -- 13. Precise parameter measurements -- 14. Structure of polycrystalline aggregates -- 15. Stress measurement -- 16. Orientation of single crystals -- 17. Crystal quality -- 18. Polymers -- 19. Small angle scattering -- 20. Transmission electron microscopy |
| Notes |
Previous ed.: Reading, Mass.: Addison-Wesley, 1978 |
| Bibliography |
Includes bibliographical references and index |
| Subject |
X-rays -- Diffraction.
|
|
X-ray crystallography.
|
| Author |
Stock, Stuart R.
|
| ISBN |
0201610914 : |
|
0131788183 International edition |
|
